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Jitter time determination method and device, storage medium and electronic equipment

A technology of jitter time and determination method, which is applied in measuring devices, electronic circuit testing, measuring electricity, etc., can solve problems such as complicated processes, and achieve the effect of reducing labor costs

Active Publication Date: 2020-05-22
CHANGXIN MEMORY TECH INC
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Problems solved by technology

[0005] The purpose of the present disclosure is to provide a method and device for determining the jitter time, a storage medium and electronic equipment, and then at least to a certain extent overcome the problem in the prior art that the oscilloscope is used to measure the jitter time and the process is complicated

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  • Jitter time determination method and device, storage medium and electronic equipment
  • Jitter time determination method and device, storage medium and electronic equipment
  • Jitter time determination method and device, storage medium and electronic equipment

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Embodiment Construction

[0063] Example embodiments will now be described more fully with reference to the accompanying drawings. However, the example embodiments can be implemented in various forms, and should not be construed as being limited to the embodiments set forth herein; on the contrary, these embodiments are provided so that this disclosure will be comprehensive and complete, and fully convey the concept of the example embodiments To those skilled in the art. In the figures, the same reference numerals denote the same or similar parts, and thus their repeated description will be omitted.

[0064] Furthermore, the described features, structures or characteristics may be combined in one or more embodiments in any suitable manner. In the following description, many specific details are provided to give a sufficient understanding of the embodiments of the present disclosure. However, those skilled in the art will realize that the technical solutions of the present disclosure can be practiced wit...

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Abstract

The invention relates to a jitter time determination method and device, a storage medium and electronic equipment. The jitter time determination method comprises the steps: determining a plurality ofdetection time points of an integrated circuit output signal; respectively comparing the output signals of a plurality of detection time points with a preset signal so as to judge whether each detection time point is a jitter point or not; and determining the jitter time of the integrated circuit output signal according to the jitter point. The jitter time of the output signal of the integrated circuit chip can be determined without extra equipment.

Description

Technical field [0001] The present disclosure relates to the technical field of integrated circuit testing, and in particular to a method and device for determining jitter time, a storage medium and electronic equipment. Background technique [0002] With the development of electronics and communication technology, jitter is not only an important consideration in analog design, but also in the field of data design. Jitter can be understood as the measurement result of the time domain change of the signal. Jitter describes the deviation of the signal period from its ideal value. [0003] Currently, an oscilloscope is usually used to measure the waveform of the signal to determine the jitter time. However, on the one hand, this measurement method requires an oscilloscope to be configured on the test machine or an external oscilloscope; on the other hand, the oscilloscope measures a single waveform, that is to say, it is generally difficult to measure multiple waveforms with an oscil...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
CPCG01R31/2882G01R31/31709G01R31/2856G01R31/31713G01R31/31718G01R31/31726
Inventor 陆天辰李垣杰
Owner CHANGXIN MEMORY TECH INC
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