A unified system with a machine learning feature data pipeline that can be shared among various product areas or teams of an electronic platform is described. A set of features can be fetched from multiple feature sources. The set of features can be combined with browsing event data to generate combined data. The combined data can be sampled to generate sampled data. The sampled data can be presented in a format having a structure that is agnostic to a feature source from which the set of features was fetched. The sampled data can be joined with old features by a backfilling process to generate training data designed to train one or more machinelearning models. Related methods, apparatuses, articles of manufacture, and computer program products are also described.
The present invention is a semiconductor design system that acquires semiconductordesign data designed by a customer, and, on the basis of the acquired design data, obtains semiconductordesign data for manufacturing a semiconductor. The semiconductor design system comprises: a manufacturing condition optimization unit that acquires design data designed by a customer and performs manufacturing condition optimization thereon to obtains design data; and a design environment optimization processing unit that acquires the design data subjected to the manufacturing condition optimization by the manufacturing condition optimization unit, performs design environment optimization thereon to obtain change content data, and transmits the obtained change content data to the customer, wherein design data that has been changed on the basis of the change content data is acquired from the customer.