9 results about "Design support system" patented technology

Provide appropriate layout information. [Solution] The layout design support device 100 comprises an estimation means and an output means. The estimation means is a trained model for inferring layout information, which includes layout items used for designing the layout of a facility for manufacturing a product, from condition information, which includes condition items representing the conditions for manufacturing a product. The estimation means applies the condition information to the trained model generated by a neural network to estimate the layout information. The output means outputs the layout information estimated by the estimation means.

The present invention supports design by enabling the checking of a determination rule in consideration of material-specific characteristics or physical properties, and enabling, in the design stage, the evaluation of corrosion resistance and durability of a product to be designed.　This design support system defines a determination rule related to a combination of component materials, recognizes an adjacent component on the basis of a feature value acquired from information of a model to be designed by using a predetermined function associated with the determination rule, and determines the suitability of the combination of the materials by using the material of the adjacent component and first material determination information in which a theoretical value related to the combination of the materials is registered. The determination rule includes a threshold value of an electrochemical potential, and a theoretical value of the electrochemical potential is registered in the first material determination information. It is determined whether the combination of the materials in the adjacent component conforms to the determination rule on the basis of comparison between the theoretical value of the electrochemical potential corresponding to the combination of the materials of the adjacent component and the threshold value of the determination rule.

This estimation device comprises: an input unit that receives an input of a target condition related to a physical property of a composition; a generation unit that generates design information of the composition; an estimation unit that estimates the physical property on the basis of the design information; and an output unit that outputs a score indicating the degree of conformity between an estimated value of the physical property and the target condition in association with the design information.

The design support system includes: a design department that designs the wafer process and packaging process; a wafer process department that manages the wafer process; a packaging department that manages the packaging process for the wafer manufactured by the wafer process department; and an integration unit that obtains wafer process information measured in the wafer process from the wafer process department, obtains packaging process information measured in the packaging process from the packaging department, and provides design support information derived from the wafer process information and packaging process information to the design department.

This system allows for the checking of judgment rules that take into account the inherent properties or physical characteristics of materials, thereby supporting the design process by enabling evaluation of the corrosion resistance and durability of the product being designed at the design stage. [Solution] The design support system defines a judgment rule regarding the combination of component materials, recognizes adjacent components based on feature quantities obtained from the model information of the design target using a predetermined function linked to the judgment rule, and determines the suitability of the material combination using the material of the adjacent component and first material judgment information which has registered theoretical values ​​regarding the material combination. The judgment rule includes a threshold value for electrochemical potential, and the first material judgment information has registered theoretical values ​​for electrochemical potential. Based on a comparison between the theoretical value for electrochemical potential corresponding to the material combination of the adjacent component and the threshold value of the judgment rule, it determines whether the material combination in the adjacent component conforms to the judgment rule.

We provide technology that supports the design of products that can evaluate environmental performance throughout their entire lifecycle. [Solution] The design support system includes a storage unit that stores product component configuration information, alternative parts information, usage scenario information that defines product usage scenarios, regulatory information that specifies regulations concerning the product, improvement item information that includes improvement items for the product's environmental indicators, and constraint information that the product must satisfy; an improvement item identification unit that identifies target values ​​for environmental indicators that must be satisfied throughout the product's lifecycle according to at least one of the usage scenarios, regulations, and improvement items; an alternative parts identification unit that identifies one or more alternative parts that can be replaced while satisfying the constraints; a calculation unit that identifies predicted values ​​for the environmental indicators of the substituted product; and an output unit that outputs alternative parts whose predicted values ​​for environmental indicators exceed the target values.

To provide a design support system that assists even inexperienced design engineers in appropriately selecting new materials and components suitable for the purpose of product design, and that can also present the annual cost-effectiveness of design changes using new materials and components. [Solution] The design support system 1 is equipped with a database 120, a machine learning means 110, an input means 310, and a display means 320. The database stores design information for multiple materials and parts that make up a product in advance. The machine learning means generates a trained model 130 that extracts design information with a high degree of fit to the design target information, using the multiple design information as training data 112. The trained model then calculates the functional fit and cost fit for existing materials and parts and new design candidates individually, based on the design target values ​​input by the design engineer. Furthermore, the display means displays the respective fit scores side by side so that the design engineer can easily understand the comparison results.

This reduces the time required from designing semiconductor devices using miniaturized chips and chiplets to the front-end and back-end production processes. [Solution] The system includes a wafer process unit that manages a wafer process for manufacturing wafers based on silicon design data, a packaging process unit that manages a packaging process for packaging chips obtained from wafers manufactured in the wafer process based on package design data, and an analysis unit that acquires silicon design data, package design data, manufacturing data from the wafer process, and manufacturing data from the packaging process, determines whether the product is good or defective, and outputs at least one corrective action based on the results of a cause analysis performed in the case of a defective product, which includes a process to change the process recipe in the wafer process and / or the packaging process, a process to change the semiconductor design kit, and a process to change either or both of the silicon design data and the package design data.