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Contact type thickness measuring device and system using same and measuring method thereof

A thickness measurement and contact technology, which is applied in the field of contact thickness measurement devices, can solve the problems of cumbersome measurement process, large investment in mechanical equipment, and increased difficulty of measurement.

Pending Publication Date: 2020-06-12
北京二十一世纪科技发展有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] In the above two methods, there is the problem of adjusting the benchmark of the measured object. In order to improve the measurement accuracy requirements, the mechanical precision of the platform where the measured object is located is very high. If the position of the measured object is adjusted, this will undoubtedly increase the difficulty of measurement. , which makes the measurement process more cumbersome, the investment in mechanical equipment is greater, and affects the measurement accuracy to a certain extent

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  • Contact type thickness measuring device and system using same and measuring method thereof
  • Contact type thickness measuring device and system using same and measuring method thereof
  • Contact type thickness measuring device and system using same and measuring method thereof

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[0031] In order to more clearly understand the above objects, features and advantages of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the described embodiments are some, not all, embodiments of the present invention. The specific embodiments described here are only used to explain the present invention, but not to limit the present invention. All other embodiments obtained by those skilled in the art based on the described embodiments of the present invention belong to the protection scope of the present invention.

[0032] A contact type thickness measuring device, comprising a first clip 1, a second clip 2, a telescopic part 3, a first guide part, a second guide part, a base part 5 and a displacement sensing part 6, the telescopic part 3 One telescopic end is used to drive the first clip 1 to move along the first guide part, and the other tel...

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Abstract

The invention relates to the technical field of thickness measurement, in particular to a contact type thickness measuring device and a system using the same and a measuring method thereof. The devicecomprises a first clamping piece, a second clamping piece, a telescopic part, a first guide part, a second guide part, a base part and a displacement sensing part, one telescopic end of the telescopic part is used for driving the first clamping piece to move along the first guide part; the other telescopic end of the telescopic part is used for driving the second clamping piece to move along thesecond guide part; and the relative movement direction of the first clamping piece and the second clamping piece is parallel to the telescopic direction of the telescopic part, a measuring opening isformed between the first clamping piece and the second clamping piece, the base part is used for providing support for the first guide part and the second guide part, and the displacement sensing partis used for measuring the displacement of the telescopic part. According to the scheme, the process of adjusting the position of the measured object is avoided, the investment of mechanical equipmentis effectively reduced, the measurement difficulty is reduced, the measurement precision is improved, the production cost is reduced, and the measurement process is quicker and more efficient.

Description

technical field [0001] The invention relates to the technical field of thickness measurement, in particular to a contact type thickness measurement device, a system using the device and a measurement method thereof. Background technique [0002] At present, in many occasions in industrial production, it is necessary to use contact measurement methods to determine the thickness of incoming materials or finished products, especially for some special materials, such as transparent materials such as glass. Measurement methods. [0003] The continuous on-line measurement devices commonly used in the current production line require a fixed position reference between the measured object and the measurement device and a small error to ensure measurement accuracy. For example, in the prior art, there are generally the following two situations: [0004] 1. Use two clamps to clamp the measured object, both clamps are driven by a driving device such as a cylinder, and clamp the measur...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B7/06
CPCG01B7/10
Inventor 叶胜钱周新聊李涛夏滨张生海田勇杨海明
Owner 北京二十一世纪科技发展有限公司