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A method and device for nondestructively detecting the quality of conductive materials based on continuously collected information

A conductive material, non-destructive testing technology, applied in measuring devices, material analysis by electromagnetic means, material resistance, etc., can solve the problems of lack of key information, inability to detect the quality of materials and determination of defect characteristics, and inability to continuously obtain information, etc. To achieve the effect of a variety of materials

Active Publication Date: 2022-05-17
CENT SOUTH UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The above existing technologies are all to detect the samples to be tested in sections or points one by one. The time and space are discrete, and the information of the actual material cannot be obtained continuously. It is directly averaged, and it is difficult to accurately determine the mutation point of the information, resulting in the inability to determine the quality of the test material and its defect characteristics

Method used

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  • A method and device for nondestructively detecting the quality of conductive materials based on continuously collected information
  • A method and device for nondestructively detecting the quality of conductive materials based on continuously collected information
  • A method and device for nondestructively detecting the quality of conductive materials based on continuously collected information

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0061] Testing material: aluminum alloy cast-rolled wire, diameter 3.5mm, length about 1680mm;

[0062] Binding post spacing / detection area length: 155mm;

[0063] Input constant current: 0.6A;

[0064] Relative motion mode: the detection device is stationary, and the detection material is in motion;

[0065] Relative movement speed: 20mm / s;

[0066] Information collection frequency: 30 times / s;

[0067] Standard sample voltage: 0.2763mV;

[0068] Figure 6 is the measured voltage-distance curve, U r =0.00055, according to|measured voltage-standard sample voltage| / standard sample voltage≥U r , it is judged that there are 3 defects, the position of the first defect is (455mm, 555mm), Y m1 =0.2780mV, the second defect position is (922mm, 969mm), Y m2 =0.2800mV, the third defect position is (1396mm, 1400mm), Y m3 = 0.2810mV.

[0069] The first defect determination factor U y1 =(0.2780-0.2763)÷0.2763=0.006153, within the range of 300mm-400mm, the voltage rises abnormall...

Embodiment 2

[0073] Testing material: extruded aluminum rod, diameter 9.5mm, length 1100mm;

[0074] Binding post spacing / detection area length: 120mm;

[0075] Input constant current: 2.0A;

[0076] Relative motion mode: the detection device is stationary, and the detection material is in motion;

[0077] Relative movement speed: 50mm / s;

[0078] Information collection frequency: 50 times / s;

[0079] Standard sample voltage: 0.09539mV;

[0080] Figure 10 is the measured voltage-distance curve, U r =0.001320, according to|measured voltage-standard sample voltage| / standard sample voltage≥U r , it is judged that there is one defect, the position is (653mm, 670mm), Y m =0.09431mV, defect determination factor U y =(0.09431-0.09539)÷0.09539=-0.01132, within the position range of 533mm-550mm, the voltage drops abnormally, and the corresponding defect enters the detection area; within the position range of 653mm-670mm, the voltage returns to normal, and the corresponding defect leaves th...

Embodiment 3

[0082] Detection material: diameter 9.5mm, length 1500mm; binding post interval / length of detection area: 120mm;

[0083] Input constant current: 2.0A;

[0084] Relative motion mode: the detection device is stationary, and the detection material is in motion;

[0085] Relative movement speed: 50mm / s;

[0086] Information collection frequency: 50 times / s;

[0087] Standard sample voltage: 0.09539mV;

[0088] It is the same batch of extruded aluminum rods as in Example 2, and the defect judgment threshold is the same.

[0089] Figure 12 is the measured voltage-distance curve, U r =0.001320, according to|measured voltage-standard sample voltage| / standard sample voltage≥U r , it is judged that there is one defect, and the defect position is (558mm, 588mm), Y m =0.09586, defect determination factor U y =(0.09586-0.09539)÷0.09539=0.004927, within the position range of 438mm-468mm, the voltage drops abnormally, and the corresponding defect enters the detection area; within t...

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Abstract

The invention relates to a method and device for non-destructive testing of the quality of conductive materials based on continuously collected information, belonging to the technical field of non-destructive testing. The detection method is: during detection, there is relative motion between the detection material and the detection device, and the quality of the measured conductive material is determined by continuously collecting and analyzing information, the information includes but not limited to voltage, current, and position, and the information is Continuous information, the continuous information is the information of continuously collecting different positions of the detection material; comparing the measured voltage or current information with the voltage or current information of the standard sample, when |actually measured information-standard sample information| / standard sample information is greater than When it is equal to the defect judgment threshold, it is determined that there is a defect in the area corresponding to the measured information. When |Actual Measured Information-Standard Information| / Standard Information is less than the defect judgment threshold, it is determined that the quality of the area corresponding to the measured information is qualified.

Description

technical field [0001] The invention relates to a method and device for non-destructive testing of the quality of conductive materials based on continuously collected information, belonging to the technical field of non-destructive testing, in particular to the technical field of continuous non-destructive testing. Background technique [0002] In modern society, the requirements for the quality of materials and their products are constantly increasing. However, due to the lack of efficient online detection and monitoring systems, product quality is not guaranteed. Establishing an online information collection and detection system in the production process, and improving product quality through sensitive information feedback and precise production process control have always been a matter of great concern to our country's scientific and technological workers, technicians and production enterprises. Currently used online quality inspection methods, such as infrared inspection...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N27/00G01N27/04
CPCG01N27/00G01N27/041
Inventor 李红英
Owner CENT SOUTH UNIV