A low-frequency digital circuit comprehensive test system and its test method

Abstract

The invention discloses a low-frequency digital circuit comprehensive test system and a test method thereof, comprising a test interaction unit, a data processing system, a tested board test unit and a standard board test unit, and the data processing system is connected with the test interaction unit and the tested board test unit respectively The unit and the standard board test unit realize bidirectional electrical connection, and the data processing system realizes bidirectional connection with a networked large database through an optical fiber network or a 4G wireless network. The invention relates to the technical field of circuit testing systems. The low-frequency digital circuit comprehensive test system and its test method can realize rapid data processing when testing circuit boards with large quantities and large test capacity, greatly improving test efficiency, small test error, and ensuring the accuracy of test results. At the same time, the data analysis time is greatly shortened, the data processing efficiency is improved, and there is no need for testers to spend a lot of time waiting, which greatly facilitates the data processing work of testers.

Description

technical field [0001] The invention relates to the technical field of circuit test systems, in particular to a low-frequency digital circuit comprehensive test system and a test method thereof. Background technique [0002] A digital circuit refers to a circuit that uses digital signals to perform arithmetic and logical operations on digital quantities. It is called a digital circuit, or a digital system. Because it has logical operations and logic processing functions, it is also called a digital logic circuit. The test objects of low-frequency digital circuits are often different, resulting in different performance requirements of digital circuits for the test system. For example, the small-scale and simple digital circuits used in DC inverter air conditioners require the test system to meet the number of channels and low The test frequency requirements are sufficient; large-scale radar base stations have high requirements for data processing speed, and related electronic...

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Problems solved by technology

[0008] Aiming at the deficiencies of the prior art, the present invention provides a low-frequency digital circuit comprehensive test system and its test method, which solves the problem that the existing test system is still relatively slow in the face of circuit board tests with large batches and large test capacity. , and the test efficiency is low, the test error is still large, the test error caused by human factors in the test process cannot be reduced, the data analysis time is long, and the processing efficiency is low

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