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Synchronous dynamic random access memory testing method and device

A random access memory, synchronous dynamic technology, applied in the computer field, can solve problems such as poor test accuracy of SDRAM

Inactive Publication Date: 2020-09-04
ZHEJIANG DAHUA TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The embodiment of the present invention provides a synchronous dynamic random access memory testing method and device, to at least solve the technical problem of poor test SDRAM accuracy

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  • Synchronous dynamic random access memory testing method and device

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Embodiment Construction

[0028] In order to enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only It is an embodiment of a part of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts shall fall within the protection scope of the present invention.

[0029] It should be noted that the terms "first" and "second" in the description and claims of the present invention and the above drawings are used to distinguish similar objects, but not necessarily used to describe a specific sequence or sequence. It is to be understood that the data so used are interchangeable under appropriate ...

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Abstract

The invention discloses a method and a device for testing a synchronous dynamic random access memory. The method comprises the steps that pre-configured first test data are acquired, the first test data are used for testing whether a connection fault exists in a synchronous dynamic random access memory SDRAM or not, and the first test data comprise multiple pieces of test data; writing the first test data into the SDRAM to obtain a first writing result; after a first write-in result is read and a first read result is obtained, comparing the first read result with a first predetermined output result to obtain first statistical data; and under the condition that the first statistical data is greater than a first predetermined threshold, determining that the SDRAM has a connection fault. According to the invention, the technical problem of poor SDRAM testing accuracy is solved.

Description

technical field [0001] The invention relates to the field of computers, in particular to a method and device for testing a synchronous dynamic random access memory. Background technique [0002] In the prior art, in the process of testing the synchronous dynamic random access memory SDRAM, usually after writing a piece of data, the data is read out immediately, so as to test whether the SDRAM is faulty. [0003] However, since the above test method needs to read the data immediately after each data is written, it is impossible to accurately test whether there is a connection line fault in the SDRAM. That is to say, the existing method for testing SDRAM has poor testing accuracy for SDRAM. [0004] For the above problems, no effective solution has been proposed yet. Contents of the invention [0005] The embodiment of the present invention provides a synchronous dynamic random access memory testing method and device to at least solve the technical problem of poor testing ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G11C29/56
CPCG11C29/56
Inventor 杨超孙海年徐建方伟
Owner ZHEJIANG DAHUA TECH CO LTD
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