Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Node testing method and device, storage medium and electronic device

A test method and node technology, applied in the computer field, can solve problems such as incomplete testing

Pending Publication Date: 2020-10-23
BEIJING KINGSOFT CLOUD NETWORK TECH CO LTD
View PDF0 Cites 6 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The present application provides a node testing method and device, a storage medium, and an electronic device to at least solve the problem of incomplete testing caused by limitations of testing tools in computing node kernel methods in the related art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Node testing method and device, storage medium and electronic device
  • Node testing method and device, storage medium and electronic device
  • Node testing method and device, storage medium and electronic device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiment of the application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiment of the application. Obviously, the described embodiment is only It is an embodiment of a part of the application, but not all of the embodiments. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without creative efforts shall fall within the scope of protection of this application.

[0037] It should be noted that the terms "first" and "second" in the description and claims of the present application and the above drawings are used to distinguish similar objects, but not necessarily used to describe a specific sequence or sequence. It is to be understood that the data so used are interchangeable under appropriate circumstances such...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a node test method and device, a storage medium and an electronic device. The method comprises the steps of testing a target service module of a target node to obtain a firsttest result of a target kernel, wherein the target service module is used for processing target service of the target node, and the target kernel is a kernel corresponding to the target node; testingthe target service scene of the target virtual machine to obtain a second test result of the target kernel, the target virtual machine being a virtual machine on the target node; and testing the nodeabnormal scene of the target node to obtain a third test result of the target kernel, the test result of the target kernel comprising the first test result, the second test result and the third test result. According to the invention, the problem of incomplete testing caused by limitation of a testing tool in a computing node kernel mode in related technologies is solved.

Description

technical field [0001] The present application relates to the computer field, and in particular to a node testing method and device, a storage medium and an electronic device. Background technique [0002] At present, when performing kernel stability tests on computing nodes, the existing open source LTP (LinuxTest Project, a group of projects designed to test and improve Linux systems) tools are usually used to perform initialization tests on the kernel, mainly including: hard disk, I / O O test, memory management stress test, IPC (Inter-Process Communication, inter-process communication) stress test, SCHED test, command function verification test and system call function verification test, etc. [0003] However, using the LTP tool to test the stability of the new version of the kernel of the computing node, there are often cases where the LTP (LinuxTest Project, Linux test project) version is not completely consistent with the kernel version, and some error messages about un...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F9/455G06F11/22
CPCG06F9/45558G06F11/2236G06F2009/4557G06F2009/45595
Inventor 杨晶晶
Owner BEIJING KINGSOFT CLOUD NETWORK TECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com