Sample extension method and device and readable storage medium
An extension method and sample technology, which can be used in instruments, character and pattern recognition, calculation models, etc., and can solve problems such as poor sample extension effect.
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[0024] It should be understood that the specific embodiments described here are only used to explain the present application, not to limit the present application.
[0025] The embodiment of this application provides a sample extension method. In the first embodiment of the sample extension method of this application, refer to figure 1 , the sample extension method includes:
[0026] Step S10, acquiring samples to be expanded, and mapping the samples to be expanded to initial sample representations of the preset first feature dimension and converted sample representations of the preset second feature dimension based on the preset representation extraction model;
[0027] In this embodiment, it should be noted that the sample expansion method is applied to the first device, the initial sample is characterized as a feature vector in the preset first feature dimension, and the converted sample is characterized as a feature vector in the preset second The feature vector of the fe...
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