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A Method for Correcting X-ray Photoelectron Spectroscopy Using Valence Band Spectrum

A photoelectron spectroscopy and X-ray technology applied in the field of X-ray photoelectron spectroscopy to achieve accurate results and easy implementation

Active Publication Date: 2022-04-05
LANZHOU INST OF CHEM PHYSICS CHINESE ACAD OF SCI +1
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  • Application Information

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Problems solved by technology

For X-ray photoelectron spectroscopy, use the band gap value measured by the valence band spectrum to correct the spectrum. This method has not been reported yet.

Method used

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  • A Method for Correcting X-ray Photoelectron Spectroscopy Using Valence Band Spectrum
  • A Method for Correcting X-ray Photoelectron Spectroscopy Using Valence Band Spectrum
  • A Method for Correcting X-ray Photoelectron Spectroscopy Using Valence Band Spectrum

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specific Embodiment

[0019] A specific embodiment of the present invention is as follows:

[0020] (1) X-ray photoelectron spectroscopy was used to analyze RbTiOPO 4 The crystal was scanned for the characteristic X-ray photoelectron spectrum (Rb 3d, Ti 2p, P 2p, O 1s), valence band spectrum, and adsorbed carbon C1s, all of which were scanned with a step size of 0.05eV to obtain high-resolution spectra Figure, such as Figure 1-6 shown;

[0021] (2) Identify RbTiOPO from the spectrum 4 The position of the characteristic peaks of each element in the crystal (Rb 3d5 / 2: 109.2eV, Ti2p3 / 2: 458.8eV, P 2p3 / 2: 133.1eV, O 1s: 531.2eV), from the valence band spectrum ( Figure 5 ) to get the value of the material bandgap (2.5eV), from Figure 6 Identify the adsorption carbon C1s peak position (284.6eV);

[0022] (3) Consult literature and books to get RbTiOPO 4 Crystal reliable bandgap value (2.5eV);

[0023] (4) RbTiOPO 4 The characteristic X-ray photoelectron spectrum of the crystal is moved accord...

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Abstract

A method for correcting X-ray photoelectron spectrum by using valence band spectrum, comprising the following steps: (1) scanning characteristic X-ray photoelectron spectrum and valence band spectrum of materials by using X-ray photoelectron spectrometer to obtain high-resolution Spectrogram test characteristic X-ray photoelectron spectrum and valence band spectrum; (2) identify the position of each element characteristic peak in the material from the described test characteristic X-ray photoelectron spectrum and valence band spectrum, and intersect with a tangent The method obtains the test bandgap value of material from the valence band spectrum that step (1) detects; (3) consults literature and books, obtains the standard bandgap value of material; (4) subtracts described standard bandgap value from described standard bandgap value; The difference obtained from the test bandgap value is moved to obtain the real characteristic X-ray photoelectron energy spectrum of the material. The invention adopts the valence band spectrum to correct the X-ray photoelectron energy spectrum, develops the X-ray photoelectron energy spectrum correction method, and obtains the real characteristic X-ray photoelectron energy spectrum of the material.

Description

technical field [0001] The invention relates to the field of X-ray photoelectron energy spectrum, in particular to a method for correcting X-ray photoelectron energy spectrum by using valence band spectrum. Background technique [0002] X-ray photoelectron spectroscopy is widely used in the fields of materials science, chemistry and physics, and is indispensable in evaluating the surface chemistry, bond structure and chemical composition of materials. According to statistics, last year alone, more than 9,000 papers using X-ray photoelectron spectroscopy have been published. [0003] The correction method for X-ray photoelectron spectroscopy generally adopts the C1s peak position of carbon adsorbed on the surface of the material, and its value is between 284.0-285.6eV, generally 284.6-285.0eV. This correction method is widely used. However, the composition and content of carbon adsorbed on the surface will change with time, resulting in a change in the position of the C1s p...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N23/2273
CPCG01N23/2273G01N2223/085G01N2223/1016G01N2223/303
Inventor 刘建郝俊英刘维民
Owner LANZHOU INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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