153 results about "Electron energy spectrum" patented technology

The invention relates to a low-temperature environmentally-friendly preparation method of nitrogen edge doped graphene, and belongs to the field of novel carbon nano-materials. The preparation method is characterized in that graphite powder and a nitrogen-containing polymer solid are mixed and subjected to continuous ball milling at a certain ball milling speed under the normal temperature and normal pressure so as to obtain a nitrogen edge doped graphene nanosheet, wherein no liquid agents are added during preparation. By analyzing through a scanning electron microscope and an atomic force microscope, the product is a lamellar structure which is uniform in dispersion and less than 1 nanometer in thickness. The analysis result of an X-ray photoelectron spectroscopy shows that the prepared product contains nitrogen, carbon, oxygen and other elements, and therefore, that the nitrogen edge doped graphene nanosheet is successfully prepared can be verified.

The present invention relates to a hard X-ray photoelectron spectroscopy (HAXPES) system comprising an X-ray source providing a beam of photons which is directed through the system so as to excite electrons from an illuminated sample. An X-ray tube is connected to a monochromator vacuum chamber in which a crystal is configured to monochromatize and focus the beam onto an illuminated sample. A hemispherical electron energy analyser is mounted onto the analysis chamber. An air gap is provided between the X-ray tube and the monochromator chamber, which air gap is provided with a first radiation trap to shield the ambient air from the radiation when the air gap is illuminated with X-rays from the source.

According to the invention, a powder catalytic material Nd<3-x>CoxNbO7 (x being greater than or equal to 0.5 and less than or equal to 1) is prepared by adopting a supercritical hydrosynthesis method and a chemical vapor condensation and deposition method; a composite porous nanometer catalytic material Nd<3-x>CoxNbO7 (x being greater than or equal to 0.5 and less than or equal to 1) -zincosilicate molecular sieve is prepared by adopting an impregnating and baking method; and a novel photoelectrode Nd<3-x>CoxNbO7 (x being greater than or equal to 0.5 and less than or equal to 1) is prepared. The three novel materials are represented: tissue morphology analysis is performed by a transmission electron microscopy, and results show that catalyst particles are irregular in shape, with the average particle size of 150 nm; phase analysis is performed by an X-ray diffractometer, and results show that Nd2CoNbO7 has a single phase, and relatively high crystallinity; the chemical speciation of the surface of the catalyst and the elementary composition of a microcell as well as the structural characteristics of an electronic shell are discussed by an X-ray photoelectron spectroscopy; and a characteristic absorption edge of the Nd2CoNbO7 is determined by a UV-Vis diffuse reflection spectroscopy to obtain the band gap width of the Nd2CoNbO7 which is 2.412 eV. Finally, the catalyst is used for decomposing water to produce hydrogen, and carrying out catalytic degradation on organic pollutants such as microcystic toxins, methylene blue and sulfamethoxazole in a water body under visible light. Experimental results show that the catalyst prepared according to the invention is good in catalytic effect.

The invention discloses a method for measuring attosecond X-ray pulses and application of the method. According to the method disclosed by the invention, each measured related phase of a photoelectron is determined by using a parameterized computing formula, and the shape of a pulse and a concrete time structure are rebuilt through one step by using an analytical photoelectron spectrum unscrambling technology; and the time domain characteristics of the attosecond X-ray pulses can be rebuilt from each measured photoelectron spectrum without a large amount of time resolution measurements of a photoelectron spectrum and without a redundant iterative computation and an experimental data fitting process. The time uncertainty of a pulse measurement result is computed from energy bandwidth values of the pulses by using the parameterized formula. Because a direct relation among attosecond pulse time characteristics, important laser parameters (such as peak strength, electric field envelope shape, phase, carrier-envelope phase and the like), atomic or molecular ionization power and the photoelectron spectrum is established by a transformation equation, the method can be used for computing unknown parameters from each known parameter value.

The present invention provides an ultimate analyzer which displays an element distribution image of an object with high contrast and high accuracy. A scanning transmission electron microscope and a method of analyzing elements using the ultimate analyzer is also provided. The ultimate analyzer comprises a scattered electron beam detector for detecting an electron beam scattered by an object; an electron spectrometer for energy dispersing an electron beam transmitted through the object; an electron beam detector for detecting said dispersed electron beam; and a control unit for analyzing elements based on an output signal of the electron beam detected by the electron beam detector and an output signal of the electron beam detected by the scattered electron beam detector.

Disclosed is a container comprising a thermoplastic wall defining an inner cavity. The wall supports a SiOx composite barrier coating or layer arranged between the wall and the inner cavity, wherein x is 1.8-2.4. High-resolution X-ray photoelectron spectroscopy (XPS) shows that one interface exists between the composite barrier coating or layer and the wall or a substrate. In one aspect, the interface has O3-Si-C covalent bonds accounting for at least 1 mol% of the proportion of O3-Si-C covalent bonds and SiO4 bonds. In another respect, the interface has chemical shift of Si 2p with the bond energy (eV) lower than the bond energy of SiO4 bonds. The result is a closely attached composite barrier coating or layer having high degree of adhesion with the substrate. The invention also provides a method of applying the composite barrier coating or layer.

The invention provides an electrolyte and an electrochemical device. The electrochemical device comprises a positive electrode, a negative electrode, an electrolyte and an isolating membrane, whereinthe positive electrode comprises a positive electrode current collector and a positive electrode active material layer arranged on the positive electrode current collector, the X-ray photoelectron spectroscopy of the positive electrode active material layer has a peak in a range of 164 eV to 175 eV, and the electrolyte retention amount of the electrochemical device is 1.0 g/Ah to 4.0 g/Ah. According to the electrochemical device and the electrolyte, the cycle performance, the over-discharge storage performance and the safety performance of the electrochemical device can be improved.

[Problem]

The present invention aims to solve the problems that size of X-ray monochromater crystal assembly is restricted and the vacuum of the X-ray source and the vacuum of the analysis chamber cannot be separated.

[Solution]

A hard X-ray photoelectron spectroscopy apparatus comprises an X-ray source, an analyzer, a sample manipulator, an analysis chamber, and vacuum evacuation systems, wherein, in a three-dimensional space defined by a XYZ rectangular coordinate axis system, a plate-like sample is arranged to be rotatable around the Z-axis by said sample manipulator (2), wherein said X-ray source comprises an electron gun (3b) which accelerates and focuses electrons, a target which is irradiated with the electrons accelerated and focused by the electron gun to generate an X-ray, monochromater crystal assembly, wherein the monochromater crystal assembly meets the Bragg condition of X-ray diffraction in X-Y plane to diffract/reflect and monochromatize the X-ray generated in said target and extract characteristic X-rays only, and on the other hand, the electron-beam-irradiation position on the target-center of the monochromater crystal assembly-center of the sample is arranged on the Rowland circle to minimize focusing aberration to the sample, the monochromater crystal assembly is located on a circle having a radius twice as large as that of the Rowland circle in a X-Y plane, preferably electron-beam-irradiation position on said target and the center of the sample are located on each of two focuses of an ellipse coming in contact with said Rowland circle in the center of the monochromater crystal assembly, said monochromater crystal assembly has a toroidal surface in Z axial direction acquired by rotating said ellipse coming in contact with said Rowland circle around a straight line connecting the electron-beam-irradiation position on said target and the center of the sample, and, a vacuum vessel for installing these components, wherein the monochromater crystal assembly used for monochromatization with diffraction and reflection of said X-ray source is located on the Rowland circle together with said target and said sample to meet the condition that the dispersed X-ray beam concentrates on the surface of the sample with the minimum aberration, wherein said Rowland circle is located to be orthogonal to the surface of the sample, wherein an optical axis of said analyzer is placed to be perpendicular (in X axial direction) to the incident direction (in Y axial direction) of the X-ray or within a range of ±36 degree angle in a X-Y plane and within a range of ±49 degree angle in a X-Z plane, wherein the sample is such that said X-ray diffracted and reflected by a reflection surface is located on focus positions on the surface of said sample and is obliquely incident on the surface of said sample, so that the spot of said X-ray elongatedly extends along a line in substantially parallel to Y axis (substantially perpendicular to X axis), and wherein an aperture of a slit provided at the entrance of said analyzer is arranged in parallel to a direction where said X-ray spot on the sample surface elongatedly extends.

An electron spectroscopy system and method are disclosed. In another aspect, an ultrabright and ultrafast angle-resolved electron spectroscopy system is provided. A further aspect of the present system employs an electron gun, a radio frequency cavity and multiple spectrometers. Yet another aspect uses spectrometers in an aligned manner to deflect and focus electrons emitted by the electron gun. Moreover, an ultrafast laser is coupled to an electron spectroscopy system. A bunch of monochromatic electrons have their energy compressed and reoriented in an additional aspect of the present system. A further aspect of the present electron spectroscopy system employs adaptive and/or adjustable optics to optimize both time and energy compression. Another aspect provides at least two RF lenses or cavities, one before a specimen and one after the specimen.

An electron spectrometer includes: an energy analyzer section that energy-analyzes electrons emitted from a specimen; a micro-channel plate that amplifies the electrons analyzed by the energy analyzer section; a fluorescent screen that converts the electrons amplified by the micro-channel plate into light; a camera that photographs the fluorescent screen; and an effective range calculation section that calculates an effective range of the fluorescent screen within a camera image photographed by the camera, the effective range calculation section performing a process that acquires a plurality of the camera images photographed while causing the energy analyzer section to analyze the electrons with a different center energy, a process that converts the plurality of camera images respectively into a plurality of spectra, and a process that calculates the effective range of the fluorescent screen within the camera image based on the plurality of spectra.

The invention discloses a method for directly obtaining oxygen potential and structure of a material interface, and belongs to the technical field of material interface research. The method comprises the following steps of: etching the surface of a fresh solid sample to form a to-be-detected sample interface; carrying out XPS detection on the to-be-detected sample interface by using an Al K alpha or Mg K alpha X-ray to obtain an X-ray photoelectron spectroscopy full spectrum and a target element high-resolution spectrum; according to full-spectrum quantification and high-resolution spectrogram fitting processing, obtaining element quantitative information and valence state distribution information of the to-be-detected sample interface; performing multivariate thermodynamic calculation according to the element quantitative information of the interface to obtain the interface oxygen potential of the to-be-detected sample interface; obtaining the structure information of the to-be-detected sample interface according to the valence state distribution information; and according to the etching information, obtaining structure changes of different depths. The method solves the problem that the interface oxygen potential and the interface structure are difficult to directly obtain.

The invention discloses a light and X-ray photoelectron energy spectroscopy synchronous analyzing and testing device. The device comprises an X-ray source arranged in a vacuum chamber, an electron transmission lens, an electron-energy analyzer and a detector, and the device further comprises an externally applied light source which comprises a light source probe, a light source generator and a light source controller; the light source generator is arranged outside the vacuum chamber and connected with the light source probe and the light source controller, light sent by the light source probe irradiates the surface of a sample, and the light source controller is arranged outside the vacuum chamber. According to the light and X-ray photoelectron energy spectroscopy synchronous analyzing and testing device, the externally applied light source is additionally arranged on the basis of an existing X-ray photoelectron energy spectroscopy technology, the situation that the externally applied light source and X-rays synchronously irradiate the surface of a material for physical property analysis is achieved, the application range of the X-ray photoelectron energy spectroscopy characterization analysis technology is extended, and therefore the physical property of the interior of the material can be accurately researched.

The invention uses energy complementary relation of surface acoustooptic effect of conductor and semiconductor material and surface photovoltaic effect, combines results of optical acoustic spectrum and surface photovoltage spectrum, supplies a optical acoustic and photovoltaic detecting method of surface electron-phonon of conductor and semiconductor material. Using measuring method, can directly discuss; interaction of electron-phonon on surface and interface of conductor and semiconductor, and effective effective channel of radiationless de excitation course happened on surface and interface. The invention has properties of noncontiguous, nonpreprocessing, quick testing and high sensitivity, whose sensitivity can reach photovoltage spectrum multiply to the power. Atoms/cu cm which is usually higher than some standard energy spectrum or spectrum such as multiply PS or Auger electron energy spectrum several order of magnitude. The apparatus is simple and convenient, whose operation can be under room temperature and acoustooptic signal created by exciton in radiationless de excitation course can be observed, mostly important, it can supply information of electron-phonon on material surface and interface.

The invention relates to a three-channel runaway electron energy spectrum measuring device under nanosecond pulse discharge, comprising: a nanosecond pulse power supply, a discharge chamber, a runaway electron beam collector and an oscilloscope which are successively connected, wherein the runaway electron beam collector comprises three or more same coaxial collectors each having a signal output end and each being connected to the oscilloscope via a coaxial cable, the output end of the nanosecond pulse power supply is connected to the oscilloscope via a voltage divider. The three-channel runaway electron energy spectrum measuring device can measure the runaway electrons generated by discharging in different regions so as to analyze the time-domain distribution and the energy spectrum distribution of the runaway electrons in space, and can be widely applied to the theoretical analysis and application research of nanosecond pulse discharge.

The invention discloses a preparation method of a Pd-PdH0. 706-PdO-NiOxHy/C core-shell electrocatalyst. The preparation method is a solvothermal method, and comprises the following steps of under an alkaline condition, taking tert-butyl alcohol as a solvent, heating by using a drying oven at 180 DEG C to prepare the Pd-PdH0. 706-coated PdO-NiOxHy/C core-shell composite catalyst; representing the morphology, structure, chemical state and composition of the catalyst by a transmission electron microscope, the X-ray diffraction, the X-ray photoelectron spectroscopy and the inductively coupled plasma emission spectroscopy; at 25 DEG C, and testing the electrocatalytic activity of the electrocatalyst on the methanol and ethanol under the alkaline condition. Results show that the activity of theobtained catalyst is the highest when the dosage of the 1M KOH solution is 10ml, and the peak current densities of the catalyst for catalyzing the electrochemical oxidation of methanol and ethanol respectively reach 592.1 mA mg <-1> Pd and 1504.0 mA mg <-1> Pd.

The invention provides a preparation method of an Auger electron spectroscopy detection sample, which comprises the following steps of: providing an original detection sample, wherein the original detection sample comprises a semiconductor substrate, a weld pad arranged on the semiconductor substrate and a passivation layer arranged on the weld pad, the passivation layer is provided with an opening exposing part of the weld pad; and grounding a region to be detected and analyzed on the original detection sample. The preparation method of the Auger electron spectroscopy detection sample can effectively eliminate the charge effect on the surface of the sample during the Auger electron spectroscopy detection though grounding the region to be detected on the sample, thereby obtaining accurate Auger electron spectroscopy. The preparation method of the sample is simple and easy to operate, and can obtain remarkable benefit effects without large-cost input.