The present invention belongs to the technical field of photoelectric detection, and specifically relates to a micro-nano particle characterization
system and method based on an alternating-current
photovoltaic effect. The characterization
system comprises: a scintillating
light source module, which is used for generating intermittent optical signals, wherein the generated intermittent optical signals are directed into a particle solution to be characterized, so as to generate
scattered light; a photoelectric detection module, which comprises a photoelectric
detector, and is used for receiving the
scattered light and generating an alternating-current photoelectric
signal, wherein the photoelectric
detector comprises a
semiconductor substrate and an ultra-thin material located on the surface of the
semiconductor substrate, and the ultra-thin material is an
oxide semiconductor, a
nitride semiconductor or an organic material semiconductor; and a
signal processing module, which is used for analyzing the alternating-current photoelectric
signal and outputting physical parameters of micro-nano particles. In the present invention, intermittent optical signals are used as incident light, so that the interference of existing continuous
laser irradiation on micro-nano particles is effectively reduced; and a photoelectric
detector based on an alternating-current
photovoltaic effect is used, so that the two major technical problems of the sensitivity being insufficient and the measurement accuracy being insufficient in existing photoelectric detection technology are solved.