17 results about "Chemical state" patented technology

The application discloses a kind of film layer etching rate determination method, specifically includes the following steps: (1) on the support layer substrate of known composition, adhere one or more coating to form a film;(2) accurately obtain the thickness value and characteristic element of each coating;(3) obtain the composition and chemical state information of the most surface layer element;(4) clean etching to film;(5) record etching time, etching area, etching mode and etching energy;(6) establish the function relationship of X-ray photoelectron spectrometer argon ion sputtering source to the etching rate of corresponding coating of film.The application mainly utilizes argon ion beam to bombard the surface of film layer, then through X-ray photoelectron spectrometer (XPS) and the calculation of function relationship, can obtain the element composition and chemical state information of specified depth in film layer, and establish the function relationship of X-ray photoelectron spectrometer argon ion sputtering source to the etching rate of corresponding coating of film.

The invention relates to the technical field of material analysis, and discloses a reinforcing steel bar surface oxide structure composition microscale analysis method, which comprises the following steps: obtaining a high-fidelity sample through a layered inert protection sample preparation technology, and sequentially analyzing oxide microstructure and element distribution by adopting a scanning electron microscope-energy spectrum coupling technology, atomic-scale crystal defect observation is realized by combining a spherical aberration correction transmission electron microscope, macroscopic phase composition and microcell chemical valence information are respectively acquired synchronously through X-ray diffraction and X-ray photoelectron spectroscopy, and finally a cross-scale correlation model covering morphological characteristics, crystal structures, phase distribution and chemical states is constructed through multi-source data fusion. And micro-scale structure analysis is realized. Through combination of a multi-source characterization technology, steel bar oxide cross-scale analysis is realized, a high-fidelity sample preparation technology is adopted to guarantee an original state of a sample, a chloride ion diffusion quantitative model fused with crystal defect parameters is constructed, and rust layer protection evaluation is improved from qualitative observation to quantitative prediction.

Provided is a method for estimating abrasion resistance of polymer composite materials. The present disclosure relates to a method for estimating abrasion resistance, the method including: irradiating a sulfur compound-containing polymer composite material with high intensity X-rays; measuring an X-ray absorption in a small region of the polymer composite material while varying an energy of the X-rays, whereby a dispersion state and a chemical state of the sulfur compound are analyzed; and quantifying an inhomogeneous state of cross-link degradation in the polymer composite material based on the dispersion state and the chemical state.

The invention relates to the technical field of thin film semiconductor material analysis, and particularly discloses a quasi-in-situ X-ray photoelectron spectroscopy analysis method for environmental failure of a thin film semiconductor material. The method comprises the following steps: performing a failure environment simulation test on a sample by using an XPS in-situ illumination system and / or an XPS quasi-in-situ high-temperature gas reaction system; analyzing real-time / quasi-real-time surface chemical information of the sample in the environmental failure simulation process by using a surface analysis technology, and obtaining change rules of surface components, chemical states, electronic structures and interface structures of the sample; based on analysis of change rules of surface components, chemical states, electronic structures and interface structures of the samples, the failure mechanism of the samples under the action of the failure environment is obtained. The method aims at solving the problem that a traditional failure analysis method cannot analyze change rules of surface components, chemical states, electronic structures and interface structures in the failure process, and then basic technical support is provided for sample failure mode and failure mechanism analysis and sample design improvement.

The invention provides an XPS spectrogram analysis method and system, computer equipment and a medium, and belongs to the field of surface analysis, and the method comprises the steps: obtaining to-be-recognized XPS spectrogram data; feature extraction of different scales is carried out on the XPS spectrogram data to be recognized according to the spatial dimension from high to low, and local region features corresponding to the physical attributes of all spectral peaks in the XPS spectrogram data to be recognized are obtained; performing up-sampling on the local region features to obtain a reconstructed spectrogram; fusing the local region features and the reconstructed spectrogram to obtain a fused feature map; performing physical attribute fitting on the fused feature map, matching physical attributes with a chemical shift reference range, and determining a chemical state; and constructing a fitting peak according to the physical attribute of the spectrum peak, and generating a background curve according to the chemical state of the XPS spectrogram data to be identified. According to the method, reliable chemical state information can be extracted without manual operation and fitting of detection personnel, and the reliability of an energy spectrum analysis result is ensured while the energy spectrum analysis efficiency is improved.

Provided is a method for estimating abrasion resistance of polymer composite materials. The present disclosure relates to a method for estimating abrasion resistance, the method including: irradiating a sulfur compound-containing polymer composite material with high intensity X-rays; measuring an X-ray absorption in a small region of the polymer composite material while varying an energy of the X-rays, whereby a dispersion state and a chemical state of the sulfur compound are analyzed; and quantifying an inhomogeneous state of cross-link degradation in the polymer composite material based on the dispersion state and the chemical state.

The invention discloses a multi-dimensional quantitative detection method for microbial corrosion resistance of Cr-containing steel. The method comprises the following steps: a microbial challenge test: inoculating sulfate reducing bacteria into a culture medium, and exposing a sample in a microbial environment; performing quantitative analysis on corrosion products: performing ultrasonic rust removal on the sample by using an acid pickling solution, then calculating a weightlessness corrosion rate, and quantifying the adhesion amount of microorganisms on the surface of the sample; multi-mode electrochemical testing: monitoring the open-circuit potential and linear polarization resistance of the sample, and performing electrochemical impedance spectroscopy and potentiodynamic polarization curve testing to obtain corrosion current density and polarization resistance; surface analysis: analyzing the corrosion morphology and element distribution of the sample through a scanning electron microscope and an energy disperse spectroscopy, and determining the chemical state of the chromium element by adopting X-ray photoelectron spectroscopy to obtain the stability and the sulfur content of a passive film; and evaluating the corrosion degree: establishing a coupling model of the corrosion current density, the polarization resistance, the passivation film stability, the microorganism adhesion amount and the sulfur content, and calculating the corrosion degree.

The invention discloses a three-dimensional phase change memory and a preparation method thereof, and the method comprises the steps: sequentially depositing a dielectric layer and a metal layer on a substrate, and constructing a multilayer film structure which is periodically and alternately stacked; performing photoetching and developing on the top of the alternately stacked multi-layer film structure to form a circular hole array pattern; taking a circular hole formed by photoetching as a mask, and vertically and downwards etching to the bottom dielectric layer to obtain a deep hole etching structure; performing transverse etching on the metal layer exposed in the deep hole etching structure, wherein a groove structure is arranged between every two adjacent dielectric layers; performing plasma activation on the inner side wall of the hole in the groove structure to obtain a metal layer with high surface active site density and a dielectric layer with a relatively inert surface state; depositing a functional layer in the groove structure; and backfilling a metal material to form a top electrode. According to the invention, the chemical state of the surface of the substrate is activated in a differentiated manner, and the self-aligned deposition of the heterogeneous surface is realized in combination with the low-saturation precursor pulse, so that the stability of the three-dimensional phase change memory is improved.

The present application relates to a kind of local high pressure intake device of Laval nozzle suitable for near normal pressure photoelectron spectroscopy and application.Laval nozzle intake device includes sequentially connected flowmeter intake pipeline, angle valve, four-way flange, pipe body and Laval nozzle along the direction of gas passing;Linear drive unit for adjusting the position of Laval nozzle in Z direction and XY displacement table for adjusting the position of Laval nozzle in XY plane are sequentially set on the pipe body, linear drive unit is connected with four-way flange by double flange, pipe body is connected with double flange, XY displacement table and linear drive unit are connected by collimator;Straight flange is provided on the side of XY displacement table away from collimator;It also includes diaphragm gauge, and diaphragm gauge is communicated with four-way flange.The design of the present application can make high-speed airflow hit on sample surface, so as to form local high pressure on surface, and the chemical state and electronic structure of sample surface in reaction atmosphere can be accurately characterized in situ.

The invention relates to a graphitization degree evaluation method and system based on an oil-generating parent material, and the method comprises the steps: 1, obtaining a to-be-detected sample, and carrying out standardization treatment to obtain a standardized deposited organic carbon sample; 2, collecting a carbon element spectrogram and a Raman spectrum of the standardized deposited organic carbon sample; 3, obtaining the peak integral area of the carbon component through the carbon element spectrogram, and calculating the effective aromatic carbon content; 4, obtaining the integral intensity and the peak width of the characteristic peak through the Raman spectrum, and calculating the order degree index of the comprehensive structure; and 5, calculating the graphitization degree according to the effective aromatic carbon content and the comprehensive structure order degree index. According to the method, the effective aromatic carbon content parameter and the comprehensive structure order degree index are constructed, so that the interference of oxygen-containing functional groups on chemical state analysis is reduced, and the strength and peak shape information of Raman peaks are synthesized, so that the physical significance of the final comprehensive graphitization index (CGI) is more consistent with the nature of graphitization.

The invention relates to the technical field of atmospheric environment monitoring and analytical chemistry, and discloses an accurate measurement and conversion mechanism research method of an atmospheric active nitrogen oxide component, and the method comprises the following steps: constructing a pneumatic virtual wall suspension flow field through coaxial flow, focusing gas to be measured into filamentous flow which is not in contact with a pipe wall, and eliminating adsorption loss; non-contact transient temperature scanning is implemented by using focused infrared radiation, and different components are sequentially thermally dissociated at characteristic temperatures according to the activation energy difference; after the reaction, forcibly mixing high-temperature gas and low-temperature sheath gas by utilizing flow field driving to realize active thermal quenching, and freezing a chemical state; the total nitrogen dioxide concentration is detected by adopting a phase moving cavity enhanced absorption spectrum; and finally, establishing a concentration-temperature response relationship, and obtaining the independent concentration of each component through differential processing and inversion calculation. According to the invention, the problems of serious tube wall adsorption effect, thermal conversion retardation and multi-component spectrum overlapping interference in traditional measurement are solved, and high temporal-spatial resolution and high-sensitivity accurate measurement of atmospheric active nitrogen oxides is realized.

The present invention relates to a β-sialon phosphor and a manufacturing method thereof, and a light emitting member and a light emitting device. A β-sialon phosphor containing Eu as a luminescent center, with β-sialon as a matrix crystal, wherein the chemical states of Eu are divided into Eu 2+ , Eu 3+ , and an intermediate state thereof (denoted as Eu m ), and the existence ratio thereof satisfies the relationship of 0.1 < Eu m / (Eu 2+ + Eu 3+ + Eu m ) < 0.4 and Eu 2+ / (Eu 2+ + Eu 3+ ) > 0.7.

The invention discloses a radioactive isotope purity nondestructive testing method and system based on online detection, and belongs to the technical field of radioactive isotope detection.The radioactive isotope purity nondestructive testing method comprises the steps that 1, an excitation light source composed of center excitation light and peripheral loss light is constructed, and a compressed detection area is obtained to serve as a nanoscale light-emitting probe; 2, a resonance energy transfer probe is introduced into the nanoscale light-emitting probe, the resonance energy transfer probe has specific response to the chemical state of the nuclide, and the chemical state difference of the nuclide is converted into the energy transfer efficiency difference of the resonance energy transfer probe. By introducing an inert reference object array, a matte probe and an environment-light field transfer function, a dual environment disturbance compensation mechanism is constructed, light field distortion and signal distortion caused by environment change can be stripped in real time, meanwhile, signal drift is effectively counteracted by dynamically and finely adjusting a comparator threshold group, the nuclide chemical state judgment accuracy is improved, and the nuclide chemical state judgment accuracy is improved. And detection errors caused by environmental interference and system loss are avoided.

The invention provides a high-sensitivity detection method and system of an energy dispersion x-ray fluorescence spectrophotometer, and relates to the technical field of x-ray fluorescence spectrum detection.Initial spectral information containing photon number distribution is obtained by collecting spectral data of a to-be-detected sample, the initial spectral information is matched with an element characteristic spectrum database for analysis, and the chemical shift effect is analyzed; generating an enhanced characteristic spectrum with an element chemical state mark; adjusting excitation parameters of a light beam screening system, and optimizing a crystal reflection condition and an incident angle to obtain matched single-wavelength excitation condition parameters; the method comprises the following steps: performing cross-correlation fusion on two-channel architecture to form multi-dimensional analysis features, establishing a hierarchical mapping relationship through hierarchical feature space transformation and recognition model adaptation, completing high-sensitivity recognition of the chemical state of the element, and performing spectral data analysis, excitation parameter optimization, dual-channel cooperative processing and hierarchical mapping modeling to obtain a high-sensitivity recognition result. And high-sensitivity identification of the chemical states of the elements in the sample is realized.

The invention belongs to the technical field of detection, and particularly relates to equipment and a testing method for quasi-in-situ XPS characterization of a magnetic functional catalytic material, the equipment comprises an XPS sample introduction chamber space, an in-situ reaction tank and a sample support, the size of the sample support is matched with the XPS sample introduction chamber space and the in-situ reaction tank space, the sample support comprises a base and an upper cover which are matched with each other, and the upper cover is arranged on the base. The base and the upper cover are detachably connected, a plurality of sample holes are formed in the upper cover and comprise upper sample holes b and lower sample holes a, the lower sample holes a are used for containing samples to be detected, the size of the lower sample holes a is matched with that of the samples to be detected, and the side, provided with the lower sample holes, of the upper cover makes contact with the base. The sample upper hole b is at least partially communicated with the corresponding sample lower hole a, and the area of the communicated part is smaller than the size of the sample to be detected. The method provided by the invention can realize real dynamic observation of the chemical state information of the active species on the surface of the magnetic functional catalytic material along with the change of the chemical environment.

The utility model discloses a photocatalytic in-situ testing device based on near-normal-pressure X-ray photoelectron spectroscopy. The photocatalytic in-situ testing device comprises a near-normal-pressure XPS (X-ray photoelectron spectroscopy) cavity; the sample table is arranged in the near-normal-pressure XPS cavity; the plurality of micro-leakage valve air inlet systems are in one-to-one correspondence with the plurality of air inlets, and each micro-leakage valve air inlet system is connected to the corresponding air inlet; the vacuumizing system is connected with the air outlet; the external light source is arranged outside the near-normal-pressure XPS cavity, and the working end of the external light source points to the sample table; the working end of the X-ray gun is inserted into the near-normal-pressure XPS cavity and points to the sample table; the energy analyzer and the collection head are inserted into the near-normal-pressure XPS cavity and point to the sample table; and the analysis equipment is electrically connected with the signal output end of the energy analyzer. The in-situ XPS research of photocatalysis in the reaction atmosphere is realized, and the chemical state and the structure of the surface of the catalyst in the reaction atmosphere under the illumination condition can be truly reflected.

The application discloses an online detection-based radioisotope purity nondestructive detection method and system, and belongs to the technical field of radioisotope detection, and comprises the following steps: step 1, constructing an excitation light source composed of central excitation light and peripheral loss light, and obtaining a compressed detection area as a nanoscale luminescent probe; and step 2, introducing a resonance energy transfer probe into the nanoscale luminescent probe, wherein the resonance energy transfer probe has specific response to the chemical state of a nuclide, and converts the chemical state difference of the nuclide into the energy transfer efficiency difference of the resonance energy transfer probe. Through the introduction of an inert reference array, a dummy probe and an environment-light field transfer function, a double environment disturbance compensation mechanism can be constructed, the light field distortion and signal distortion caused by environmental changes can be stripped in real time, the signal drift can be effectively offset through dynamic fine adjustment of a simulation comparator threshold group, the accuracy of nuclide chemical state determination is improved, and detection errors caused by environmental interference and system loss are avoided.