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7 results about "Electron spectroscopy" patented technology

Electron spectroscopy is an analytical technique to study the electronic structure and its dynamics in atoms and molecules. In general an excitation source such as x-rays, electrons or synchrotron radiation will eject an electron from an inner-shell orbital of an atom. Detecting photoelectrons that are ejected by x-rays is called x-ray photoelectron spectroscopy (XPS) or electron spectroscopy for chemical analysis (ESCA). Detecting electrons that are ejected from higher orbitals to conserve energy during electron transitions is called Auger electron spectroscopy (AES).

Electron energy spectrometer, electron energy spectrum measuring method and electron energy spectrum measuring system

PendingCN121978740AOvercoming signal pile-up problemsOvercome inherent inefficienciesX-ray spectral distribution measurementLight spotElectron spectroscopy
The invention relates to the technical field of electron energy measurement, and discloses an electron spectrometer and an electron energy spectrum measurement method and system.The electron spectrometer comprises a magnetic deflection unit used for receiving an incident to-be-measured electron beam, generating a magnetic field and applying the magnetic field to all to-be-measured electrons in the to-be-measured electron beam; the scintillator fluorescent screen is arranged at the downstream of the magnetic deflection unit and used for receiving the deflected electrons to be detected, and the electrons bombard the scintillator fluorescent screen and generate light spots; the optical acquisition unit is used for acquiring a light spot image on the scintillator fluorescent screen; and the signal processing unit is used for processing the light spot image so as to identify the spatial position information of the light spot in the light spot image and convert the spatial position information into electronic energy data. The method has the beneficial effects that the unification of high resolution and high measurement efficiency is realized, and the problem of signal accumulation under a high counting rate of a traditional direct measurement method and the inherent defect of low efficiency of a scanning type magnetic spectrometer are overcome.
Owner:SHENZHEN TECH UNIV

Low-adsorption sealant films, laminates, and packaging bags

To provide a sealant film that is resistant to the adsorption of various organic compounds, has excellent heat-sealing properties at 140°C, but has low heat-sealing strength at 100°C, and prevents the heat-seal layers from sticking together when used as a packaging bag and attempting to heat the contents by boiling them in hot water. [Solution] A low-adsorption sealant film having a heat-seal layer made of at least one polyester-based component, and satisfying the following conditions (1) to (3). (1) When heat-seal layers are sealed together at 120°C, 0.2 MPa, and for 2 seconds, the seal strength is 4N / 15mm or more and 15N / 15mm or less. (2) When heat-seal layers are sealed together at 140°C, 0.2 MPa, and for 2 seconds, the seal strength is 8 N / 15 mm or more and 30 N / 15 mm or less. (3) In the heat seal layer, the oxygen atom abundance determined by X-ray electron spectroscopy (ESCA) is between 26.6% and 31.0%.
Owner:TOYOBO CO LTD

Composite particles, slurry, and secondary battery using these

PCT designated stageWO2026177200A1Electrical batteryElectron spectroscopy
The problem addressed by the present invention is to provide negative electrode active material particles which are capable of suppressing deterioration of the cycle characteristics of a lithium ion secondary battery by being used as a negative electrode active material of the lithium ion secondary battery. Composite particles according to a first aspect of the present invention each comprise: a core part that contains silicon; and a coating part that contains carbon as a main component, also contains nitrogen, and covers at least a part of the core part. With respect to a photoelectron spectrum of the composite particles obtained by X-ray electron spectroscopy, the ratio (NI1 / NI2) of "the signal intensity NI1 at 400.8 eV" to "the signal intensity NI2 at 398.5 eV" is within the range of 0.5 to 4 inclusive.
Owner:I S T CORP

Electron spectroscopy based techniques for determining various chemical and electrical characteristics of samples

A measurement system and method are presented for measuring one or more parameters of a sample. The measurement system comprises an excitation system and a detection system. The excitation system is configured to generate combined exciting radiation comprising one- or multi-parameter modulation of multiple exciting signals of different types to be applied to at least a portion of a sample under measurements to thereby induce electron emission response of said at least portion of the sample to said combined exciting radiation. The detection system is configured for detecting the electron emission response of the at least portion of the sample and generating measured data indicative of a modulated change of an electrical state of the at least portion of the sample, thereby enabling determination of one or more parameters of the sample from the measured data.
Owner:COZAI LTD

Electron spectroscopy apparatus and methods

There is described a method of determining a chemical composition of a sample using electron spectroscopy, the method comprising: ablating material from an area on a surface of a sample by irradiating the area with one or more pulses of a laser; irradiating at least part of the area with an excitation beam of electrons or electromagnetic radiation; measuring intensities and energies of electrons emitted from the at least part of the area of the sample as a result of the excitation beam; and repeating the steps of: ablating material, irradiating with the excitation beam, and measuring intensities and energies, to determine a quantitative surface depth profile of the chemical composition of at least part of the sample. There is also described an electron spectroscopy apparatus for determining a chemical composition of a sample.
Owner:UNIVERSITY OF SURREY +1

Electron spectroscopy apparatus and method

A method for determining the chemical composition of a sample using electron spectroscopy is described, the method including ablating material from a region by irradiating a surface of the sample with one or more laser pulses on the region, irradiating at least a portion of the region with an excitation beam of electron radiation or electromagnetic radiation, measuring the intensity and energy of electrons emitted from at least a portion of the region of the sample as a result of the excitation beam, and repeating the steps of ablat- ing material, irradiating with the excitation beam, and measuring the intensity and energy to determine a quantitative surface depth profile of the chemical composition of at least a portion of the sample. An electron spectroscopy apparatus for determining the chemical composition of a sample is also described.
Owner:UNIVERSITY OF SURREY +1

Titanium oxide powder and method for producing the same

ActiveCN117377640BCosmetic preparationsAlkali titanatesElectron spectroscopyTitanium oxide
The present application provides a titanium oxide powder characterized in that the ratio (I A / I R ) of the peak intensity (I A ) of an anatase crystal to the peak intensity (I R ) of a rutile crystal in X-ray diffraction measurement is 0.1 or less; the average minor axis length of the contained particles is 10 to 50 nm, and the average ratio of major axis to minor axis is 1 to 3; the ratio (A 450 / A 320 ) of the absorbance A 450 at a wavelength of 450 nm to the absorbance A 320 at a wavelength of 320 nm is 0.015 to 0.5; and nitrogen atoms are contained, and a peak from the nitrogen atoms is observed at 395 to 402 eV in ESCA (Electron Spectroscopy for Chemical Analysis) measurement. Thus, a titanium oxide powder can be provided, which is mainly composed of a rutile crystal, has excellent UVA shielding effect, is highly safe for the human body, and has a good color tone.
Owner:TAYCA CORP