3 results about "Electron spectroscopy" patented technology

The invention relates to the technical field of electron energy measurement, and discloses an electron spectrometer and an electron energy spectrum measurement method and system.The electron spectrometer comprises a magnetic deflection unit used for receiving an incident to-be-measured electron beam, generating a magnetic field and applying the magnetic field to all to-be-measured electrons in the to-be-measured electron beam; the scintillator fluorescent screen is arranged at the downstream of the magnetic deflection unit and used for receiving the deflected electrons to be detected, and the electrons bombard the scintillator fluorescent screen and generate light spots; the optical acquisition unit is used for acquiring a light spot image on the scintillator fluorescent screen; and the signal processing unit is used for processing the light spot image so as to identify the spatial position information of the light spot in the light spot image and convert the spatial position information into electronic energy data. The method has the beneficial effects that the unification of high resolution and high measurement efficiency is realized, and the problem of signal accumulation under a high counting rate of a traditional direct measurement method and the inherent defect of low efficiency of a scanning type magnetic spectrometer are overcome.

To provide a sealant film that is resistant to the adsorption of various organic compounds, has excellent heat-sealing properties at 140°C, but has low heat-sealing strength at 100°C, and prevents the heat-seal layers from sticking together when used as a packaging bag and attempting to heat the contents by boiling them in hot water. [Solution] A low-adsorption sealant film having a heat-seal layer made of at least one polyester-based component, and satisfying the following conditions (1) to (3). (1) When heat-seal layers are sealed together at 120°C, 0.2 MPa, and for 2 seconds, the seal strength is 4N / 15mm or more and 15N / 15mm or less. (2) When heat-seal layers are sealed together at 140°C, 0.2 MPa, and for 2 seconds, the seal strength is 8 N / 15 mm or more and 30 N / 15 mm or less. (3) In the heat seal layer, the oxygen atom abundance determined by X-ray electron spectroscopy (ESCA) is between 26.6% and 31.0%.

There is described a method of determining a chemical composition of a sample using electron spectroscopy, the method comprising: ablating material from an area on a surface of a sample by irradiating the area with one or more pulses of a laser; irradiating at least part of the area with an excitation beam of electrons or electromagnetic radiation; measuring intensities and energies of electrons emitted from the at least part of the area of the sample as a result of the excitation beam; and repeating the steps of: ablating material, irradiating with the excitation beam, and measuring intensities and energies, to determine a quantitative surface depth profile of the chemical composition of at least part of the sample. There is also described an electron spectroscopy apparatus for determining a chemical composition of a sample.