348 results about "X-ray photoelectron spectroscopy" patented technology

Provided is a magnetic tape in which ferromagnetic powder included in a magnetic layer is ferromagnetic hexagonal ferrite powder having an activation volume equal to or smaller than 1,600 nm³, the magnetic layer includes one or more components selected from the group consisting of fatty acid and fatty acid amide, and an abrasive, a C—H derived C concentration calculated from a C—H peak area ratio of C1s spectra obtained by X-ray photoelectron spectroscopic analysis performed on the surface of the magnetic layer at a photoelectron take-off angle of 10 degrees is equal to or greater than 45 atom %, and a tilt cos θ of the ferromagnetic hexagonal ferrite powder with respect to the surface of the magnetic layer acquired by cross section observation performed by using a scanning transmission electron microscope is 0.85 to 1.00.

Provided is a magnetic tape in which a thickness of a back coating layer is equal to or smaller than 0.20 μm, a C—H derived C concentration calculated from a C—H peak area ratio of C1s spectra obtained by X-ray photoelectron spectroscopic analysis performed on the surface of the back coating layer at a photoelectron take-off angle of 10 degrees, is equal to or greater than 35 atom %, full widths at half maximum of spacing distribution measured by optical interferometry regarding the surface of the back coating layer before and after performing a vacuum heating with respect to the magnetic tape are respectively greater than 0 nm and equal to or smaller than 10.0 nm, and a difference between a spacing measured after performing the vacuum heating and a spacing measured before performing the vacuum heating is greater than 0 nm and equal to or smaller than 8.0 nm.

The magnetic tape device includes a magnetic tape including a magnetic layer; and a TMR head (reproducing head), in which an intensity ratio of a peak intensity of a diffraction peak of a (110) plane with respect to a peak intensity of a diffraction peak of a (114) plane of a hexagonal ferrite crystal structure obtained by an X-ray diffraction analysis of the magnetic layer by using an In-Plane method is 0.5 to 4.0, a vertical direction squareness ratio of the magnetic tape is 0.65 to 1.00, Ra measured regarding a surface of the magnetic layer is equal to or smaller than 2.0 nm, and a C—H derived C concentration calculated from a C—H peak area ratio of C1s spectra obtained by X-ray photoelectron spectroscopic analysis performed on the surface of the magnetic layer at a photoelectron take-off angle of 10 degrees is 45 to 65 atom %.

The magnetic tape includes a non-magnetic layer including non-magnetic powder and a binder on a non-magnetic support; and a magnetic layer including ferromagnetic powder and a binder on the non-magnetic layer, in which the magnetic layer includes a timing-based servo pattern, a center line average surface roughness Ra measured regarding a surface of the magnetic layer is equal to or smaller than 1.8 nm, one or more components selected from the group consisting of fatty acid and fatty acid amide are at least included in the magnetic layer, and a C—H derived C concentration calculated from a C—H peak area ratio of C1s spectra obtained by X-ray photoelectron spectroscopic analysis performed on the surface of the magnetic layer at a photoelectron take-off angle of 10 degrees is equal to or greater than 45 atom %.

Provided is a magnetic tape, which comprises, on a nonmagnetic support, a nonmagnetic layer comprising nonmagnetic powder and binder, and on the nonmagnetic layer, a magnetic layer comprising ferromagnetic powder and binder; wherein at least the magnetic layer comprises one or more components selected from the group consisting of a fatty acid and a fatty acid amide; a quantity of components selected from the group consisting of a fatty acid and a fatty acid amide per unit area of the magnetic tape among components that are extracted from a surface on the magnetic layer side of the magnetic tape is less than or equal to 15.0 mg/m², and a concentration of carbon, C, that is obtained by X-ray photoelectron spectroscopy conducted at a photoelectron take-off angle of 10 degrees on the surface on the magnetic layer side of the magnetic tape is greater than or equal to 50 atom %.

The magnetic tape includes a non-magnetic layer including non-magnetic powder and a binder on a non-magnetic support; and a magnetic layer including ferromagnetic powder and a binder on the non-magnetic layer, the total thickness of the non-magnetic layer and the magnetic layer is equal to or smaller than 0.60 μm, the magnetic layer includes a timing-based servo pattern, one or more components selected from the group consisting of fatty acid and fatty acid amide are at least included in the magnetic layer, and a C—H derived C concentration calculated from a C—H peak area ratio of C1s spectra obtained by X-ray photoelectron spectroscopic analysis performed on the surface of the magnetic layer at a photoelectron take-off angle of 10 degrees is equal to or greater than 45 atom %.

The magnetic tape includes a magnetic layer having ferromagnetic powder and a binder on a non-magnetic support, in which a total thickness of the magnetic tape is equal to or smaller than 5.30 μm, the magnetic layer includes a timing-based servo pattern, a center line average surface roughness Ra measured regarding a surface of the magnetic layer is equal to or smaller than 1.8 nm, one or more components selected from the group consisting of fatty acid and fatty acid amide are included in the magnetic layer, and a C—H derived C concentration calculated from a C—H peak area ratio of C1s spectra obtained by X-ray photoelectron spectroscopic analysis performed on the surface of the magnetic layer at a photoelectron take-off angle of 10 degrees is equal to or greater than 45 atom %.

The magnetic tape has on one surface of a nonmagnetic support a magnetic layer containing ferromagnetic powder and binder, and on the other surface of the nonmagnetic support, a backcoat layer containing nonmagnetic powder and binder, wherein the total thickness of the magnetic tape is less than or equal to 4.80 μm, the backcoat layer contains one or more components selected from the group consisting of a fatty acid and a fatty acid amide, and a C—H derived carbon, C, concentration calculated from a C—H peak area ratio in a C1s spectrum obtained by X-ray photoelectron spectroscopy conducted at a photoelectron take-off angle of 10 degrees on a surface on the backcoat layer side of the magnetic tape ranges from 35 to 60 atom %.

The magnetic tape device includes: a magnetic tape; and a reproducing head, in which a magnetic tape transportation speed of the magnetic tape device is equal to or lower than 18 m/sec, the reproducing head is a magnetic head including a tunnel magnetoresistance effect type element as a reproducing element, the magnetic tape includes a non-magnetic support, and a magnetic layer including ferromagnetic powder and a binding agent on the non-magnetic support, the magnetic layer includes one or more components selected from the group consisting of fatty acid and fatty acid amide, and a C—H derived C concentration calculated from a C—H peak area ratio of C1s spectra obtained by X-ray photoelectron spectroscopic analysis performed on the surface of the magnetic layer at a photoelectron take-off angle of 10 degrees is 45 to 65 atom %.

Provided is a magnetic tape in which an Ra measured regarding a surface of a magnetic layer is equal to or smaller than 1.8 nm, Int(110)/Int(114) of a hexagonal ferrite crystal structure obtained by an X-ray diffraction analysis of the magnetic layer by using an In-Plane method is 0.5 to 4.0, a vertical squareness ratio of the magnetic tape is 0.65 to 1.00, the back coating layer includes one or more kinds of component selected from the group consisting of fatty acid and fatty acid amide, and a C—H derived C concentration calculated from a C—H peak area ratio of C1s spectra obtained by X-ray photoelectron spectroscopic analysis performed on the surface of the back coating layer at a photoelectron take-off angle of 10 degrees is equal to or greater than 35 atom %.

An electrode substrate comprising; an electrode comprising a compound containing an In atom and a substrate body, wherein a half band width ratio [In3d_5/2]_h/[In3d_5/2]_n is from 0.9 to 1.2 wherein [In3d_5/2]_h is a half band width of a 3d_5/2 orbit spectral peak of an In atom in the surface of the electrode, and [In3d_5/2]_n is a half band width of a 3d_5/2 orbit spectral peak of an In atom in the interior of the electrode, the spectral peaks being measured by X-ray photoelectron spectroscopy: and the method for the production thereof.

A carrier for use in a two component developer for developing an electrostatic latent image is provided. The carrier includes a particulate core material; and a cover layer located on a surface of the core material and including a silicone resin and barium sulfate. The cover layer includes Ba and Si at an atomic ratio of from 0.01 to 0.08 as determined by X-ray photoelectron spectroscopy.

The present disclosure provides an identification process which may employ various identification techniques on Zero platinum group metal (ZPGM) catalyst systems, in order to identify responsible materials for the formation of corrosion material, such as hexavalent chromium compounds. Identification analysis, such as X-ray diffraction analysis (XRD), X-ray fluorescence (XRF), and X-ray Photoelectron Spectroscopy (XPS) may be performed on various thermally treated ZPGM catalyst systems, such as in bare substrate, substrate with one type of ZPGM in washcoat, a substrate with one type of ZPGM in overcoat and substrate combination of ZPGM metals in both washcoat and overcoat. Results of identification analysis may show that regardless of metal catalyst (for example Ag, Cu, Ce), hexavalent chromium (Cr⁶⁺) may be formed on aged catalysts systems, which may be due to the high concentration of chromium in substrate. Therefore, corrosion and production of hexavalent chromium may initiate from elements found in the substrate and not from elements within the ZPGM metal catalysts.

Methods and systems for measuring structural and material characteristics of semiconductor structures based on combined x-ray reflectometry (XRR) and x-ray photoelectron spectroscopy (XPS) are presented herein. A combined XRR and XPS system includes an x-ray illumination source and x-ray illumination optics shared by both the XRR and XPS measurement subsystems. This increases throughput and measurement accuracy by simultaneously collecting XRR and XPS measurement data from the same area of the wafer. A combined XRR and XPS system improves measurement accuracy by employing XRR measurement data to improve measurements performed by the XPS subsystem, and vice-versa. In addition, a combined XRR and XPS system enables simultaneous analysis of both XRR and XPS measurement data to more accurately estimate values of one of more parameters of interest. In a further aspect, any of measurement spot size, photon flux, beam shape, beam diameter, and illumination energy are independently controlled.

A method for preparing hollow nanofibers having carbon as a primary component by contacting a carbon-containing compound with a catalyst at 500 to 1200° C., wherein the catalyst is one of a zeolite exhibiting thermal resistance at 900° C. and, supported thereon, a metal; a metallosilicate zeolite containing a heteroatom except aluminum and silicon and a metal; a supporting material and fine cobalt particles exhibiting a binding energy of a cobalt 2P3/2 electron of 779.3 to 781.0 eV; a supporting material and fine cobalt particles exhibiting a cobalt atom ratio in the surface of the supporting material of 0.1 to 1.5%, as measured by the X-ray photoelectron spectroscopy at 10 kV and 18 mA; a supporting material and fine cobalt particles exhibiting a weight ratio of cobalt to a second metal component of 2.5 or more; and a zeolite having a film form and a metal.