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Light and X-ray photoelectron energy spectroscopy synchronous analyzing and testing device

A technology of photoelectron spectroscopy and synchronous analysis, applied in measuring devices, using wave/particle radiation for material analysis, analyzing materials, etc., can solve the problem of inability to realize X-ray photoelectron spectroscopy analysis and testing, and limit the charge separation and migration properties of photoelectric materials and other issues to achieve the effect of expanding the scope of application

Inactive Publication Date: 2016-01-20
LANZHOU INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] However, the current X-ray photoelectron spectroscopy technology only uses a single excitation light source, which cannot realize the analysis and testing of X-ray photoelectron spectroscopy under the irradiation of an external light source, which severely limits the research on the charge separation and migration properties inside optoelectronic materials.

Method used

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  • Light and X-ray photoelectron energy spectroscopy synchronous analyzing and testing device
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  • Light and X-ray photoelectron energy spectroscopy synchronous analyzing and testing device

Examples

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Effect test

Embodiment 1

[0019] like figure 1 As shown, an illumination-X-ray photoelectron spectrum synchronous analysis test device includes an X-ray source 1 placed in a vacuum chamber 6, an electron transmission lens, an electron energy analyzer 3 and a detector 4, and the device also includes an external Carrying a light source, the external light source includes a light source probe, a light source generator 2 and a light source controller; the light source generator 2 is placed outside the vacuum chamber 6, and is connected to the light source probe and the light source controller; the light emitted by the light source probe irradiates the sample 5 surface; the light source controller is arranged outside the vacuum chamber 6, and can automatically control the illumination intensity and wavelength of the light provided by the light source probe through the light source generator 2.

[0020] The light source probe is placed outside the vacuum chamber 6 , and the wall of the vacuum chamber 6 is pr...

Embodiment 2

[0025] Under UV light irradiation, the Bi / TiO 2 Nanotube arrays were analyzed by X-ray photoelectron spectroscopy, and the results were compared with those obtained without light. The specific steps are to first test the Bi / TiO under the condition of no light 2 Nanotube arrays were analyzed by X-ray photoelectron spectroscopy, and Bi / TiO 2 Nanotube arrays for X-ray photoelectron spectroscopy. The test conditions are: the wavelength of ultraviolet light is 300nm, and the intensity is 100mW / cm 2 , the light time is 2min.

[0026] According to the Electron Spectroscopy Standard Reference Manual "XPSandAugerHandbook" published by ThermoFisher, when using monochromatic Alkα as the X-ray source, metal Bi4f 7 / 2 The peak position of the peak is around 157.0eV, Bi 2 o 3 Bi4f in 7 / 2 The peak position is around 159.0eV, TiO 2 Ti2p in 3 / 2 The peak positions of the peak and O1s peak are around 458.5eV and between 529~530.0eV, respectively. The peak position of the polluted C1s pe...

Embodiment 3

[0029] Under visible light irradiation, the BiVO 4 The porous nanometer photoelectrode was analyzed by X-ray photoelectron spectroscopy, and the results were compared with those under no light conditions. The specific steps are to test the BiVO in the absence of light first. 4 The porous nanophotoelectrode was analyzed by X-ray photoelectron spectroscopy, and then the BiVO 4 Porous nanophotoelectrodes for X-ray photoelectron spectroscopy. The test conditions are: the visible light wavelength is 450nm, and the intensity is 200mW / cm2 , the light time is 2min.

[0030] According to the Electron Spectroscopy Standard Reference Manual "XPSandAugerHandbook" published by ThermoFisher, when using monochromatic Alkα as the X-ray source, the Bi4f of Bi(Ⅲ) 7 / 2 The peak position of the peak is around 159.0eV, and the V2p of V(Ⅴ) 3 / 2 The peak position of the peak is between 516.4~517.4eV, and the peak position of the O1s peak is between 529~530.0eV. The peak position of the polluted C...

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Abstract

The invention discloses a light and X-ray photoelectron energy spectroscopy synchronous analyzing and testing device. The device comprises an X-ray source arranged in a vacuum chamber, an electron transmission lens, an electron-energy analyzer and a detector, and the device further comprises an externally applied light source which comprises a light source probe, a light source generator and a light source controller; the light source generator is arranged outside the vacuum chamber and connected with the light source probe and the light source controller, light sent by the light source probe irradiates the surface of a sample, and the light source controller is arranged outside the vacuum chamber. According to the light and X-ray photoelectron energy spectroscopy synchronous analyzing and testing device, the externally applied light source is additionally arranged on the basis of an existing X-ray photoelectron energy spectroscopy technology, the situation that the externally applied light source and X-rays synchronously irradiate the surface of a material for physical property analysis is achieved, the application range of the X-ray photoelectron energy spectroscopy characterization analysis technology is extended, and therefore the physical property of the interior of the material can be accurately researched.

Description

technical field [0001] The invention relates to an illumination-X-ray photoelectron energy spectrum synchronous analysis and testing device, which belongs to the technical field of X-ray photoelectron energy spectrum analysis and testing. Background technique [0002] X-ray photoelectron spectroscopy is an important means of surface analysis. This technology is based on the photoelectric effect. When a beam of X-rays is irradiated on the surface of a material, the photons can be absorbed by the electrons on the atomic orbitals of a certain element in the material, so that the electrons are freed from the shackles of the atomic nucleus and released from the interior of the atom with a certain kinetic energy. are emitted and become free photoelectrons. The photoelectrons are detected by the energy analyzer of the system. The analyzer records and counts the number of electrons with different kinetic energies, and then the binding energy information of the electrons in the samp...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/227
Inventor 刘佳梅毕迎普焦正波杨培菊黄晓卷任伟牛建中
Owner LANZHOU INST OF CHEM PHYSICS CHINESE ACAD OF SCI
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