Unlock instant, AI-driven research and patent intelligence for your innovation.

Method for correcting X-ray photoelectron spectroscopy by using valence band spectrum

A photoelectron spectroscopy and X-ray technology applied in the field of X-ray photoelectron spectroscopy to achieve accurate results and easy implementation

Active Publication Date: 2020-12-18
LANZHOU INST OF CHEM PHYSICS CHINESE ACAD OF SCI +1
View PDF3 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For X-ray photoelectron spectroscopy, use the band gap value measured by the valence band spectrum to correct the spectrum. This method has not been reported yet.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Method for correcting X-ray photoelectron spectroscopy by using valence band spectrum
  • Method for correcting X-ray photoelectron spectroscopy by using valence band spectrum
  • Method for correcting X-ray photoelectron spectroscopy by using valence band spectrum

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment

[0019] A specific embodiment of the present invention is as follows:

[0020] (1) X-ray photoelectron spectroscopy was used to analyze RbTiOPO 4 The crystal was scanned for the characteristic X-ray photoelectron spectrum (Rb 3d, Ti 2p, P 2p, O 1s), valence band spectrum, and adsorbed carbon C1s, all of which were scanned with a step size of 0.05eV to obtain high-resolution spectra Figure, such as Figure 1-6 shown;

[0021] (2) Identify RbTiOPO from the spectrum 4 The position of the characteristic peaks of each element in the crystal (Rb 3d5 / 2: 109.2eV, Ti2p3 / 2: 458.8eV, P 2p3 / 2: 133.1eV, O 1s: 531.2eV), from the valence band spectrum ( Figure 5 ) to get the value of the material bandgap (2.5eV), from Figure 6 Identify the adsorption carbon C1s peak position (284.6eV);

[0022] (3) Consult literature and books to get RbTiOPO 4 Crystal reliable bandgap value (2.5eV);

[0023] (4) RbTiOPO 4 The characteristic X-ray photoelectron spectrum of the crystal is moved accord...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A method for correcting an X-ray photoelectron spectroscopy by using a valence band spectrum comprises the following steps: (1) scanning a characteristic X-ray photoelectron spectroscopy and the valence band spectrum of a material by using an X-ray photoelectron spectrometer to obtain a high-resolution spectrogram to test the characteristic X-ray photoelectron spectroscopy and the valence band spectrum; (2) identifying the position of each element characteristic peak in the material from the test characteristic X-ray photoelectron spectroscopy and the valence band spectrogram, and obtaining atest band gap value of the material from the valence band spectrum detected in the step (1) in a tangent intersection manner; (3) consulting documents and books to obtain a standard band gap value ofthe material; and (4) subtracting the test band gap value from the standard band gap value to obtain a difference value, and moving the difference value to obtain the real characteristic X-ray photoelectron spectroscopy of the material. According to the invention, the valence band spectrum is used for correcting the X-ray photoelectron spectroscopy, a method for correcting the X-ray photoelectronspectroscopy is developed, and the real characteristic X-ray photoelectron spectroscopy of the material is obtained.

Description

technical field [0001] The invention relates to the field of X-ray photoelectron energy spectrum, in particular to a method for correcting X-ray photoelectron energy spectrum by using valence band spectrum. Background technique [0002] X-ray photoelectron spectroscopy is widely used in the fields of materials science, chemistry and physics, and is indispensable in evaluating the surface chemistry, bond structure and chemical composition of materials. According to statistics, last year alone, more than 9,000 papers using X-ray photoelectron spectroscopy have been published. [0003] The correction method for X-ray photoelectron spectroscopy generally adopts the C1s peak position of carbon adsorbed on the surface of the material, and its value is between 284.0-285.6eV, generally 284.6-285.0eV. This correction method is widely used. However, the composition and content of carbon adsorbed on the surface will change with time, resulting in a change in the position of the C1s p...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/2273
CPCG01N23/2273G01N2223/085G01N2223/1016G01N2223/303
Inventor 刘建郝俊英刘维民
Owner LANZHOU INST OF CHEM PHYSICS CHINESE ACAD OF SCI