Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Structural reliability sensitivity analysis method based on Lamb wave defect quantification

A sensitivity analysis and reliability technology, applied in the field of detection, can solve problems such as the difficulty in establishing a unit quantitative model, the lack of quantification of the impact of local unit defect structures on the overall reliability, etc.

Active Publication Date: 2021-01-05
BEIHANG UNIV +1
View PDF8 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] Current research mainly focuses on the influence of unit defects on the reliability prediction results of the unit itself. It is difficult to establish a quantitative model between the unit defect size and the overall reliability of the structure. There is still a lack of corresponding quantification of the impact of local unit defects on the overall reliability of the structure. research methods

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Structural reliability sensitivity analysis method based on Lamb wave defect quantification
  • Structural reliability sensitivity analysis method based on Lamb wave defect quantification
  • Structural reliability sensitivity analysis method based on Lamb wave defect quantification

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0083] The application will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain related inventions, rather than to limit the invention. It should also be noted that, for the convenience of description, only the parts related to the related invention are shown in the drawings.

[0084] It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present application will be described in detail below with reference to the accompanying drawings and embodiments.

[0085] figure 1 It shows a method of structural reliability sensitivity analysis based on lamb wave defect quantification of the present invention, the method includes the following steps:

[0086] S1. Constructing a Lamb wave defect quantitative model: determining the char...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a structural reliability sensitivity analysis method based on Lamb wave defect quantification, and the method comprises the steps: building a Lamb wave defect quantification model through a Lamb wave damage detection signal, and building a Lamb wave defect quantification uncertainty model through a maximum likelihood method, constructing a unit defect size performance parameter model by means of a strain energy release rate theory, constructing a unit fatigue crack propagation model by means of a Paris formula, constructing a structural overall dynamics model containinglocal defects by combining a finite element theory, and performing structural reliability prediction; and quantifying the influence of the quantitative uncertainty of the local unit defects in the structure on the structure reliability by adopting a sensitivity analysis method. The influence of uncertainty distribution parameters of all parameters in the Lamb wave defect quantitative model and thefatigue crack propagation model on the overall reliability of the structure is quantified, the uncertainty of reliability evaluation and life prediction results can be reduced conveniently, and the method has high practicability.

Description

technical field [0001] The invention belongs to the technical field of detection, in particular to a structural reliability sensitivity analysis method based on Lamb wave defect quantification. Background technique [0002] Sensitivity analysis is mainly to analyze the impact of the uncertainty of the quantified model input variables on the model output, so that the uncertainty of each input variable can be optimized to reduce the uncertainty of the prediction results. During the service process of the structure, due to fatigue, corrosion, aging and other reasons, the units in the structure will inevitably produce cumulative damage, which will easily lead to structural failure. Therefore, real-time monitoring of the damage in the structure and prediction of the reliability and remaining life of the structure according to the damage can avoid serious consequences caused by the failure of the structure. However, due to the uncertainty in the damage quantitative model and life...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F30/23G06F17/18G06F119/02G06F119/04
CPCG06F30/23G06F17/18G06F2119/02G06F2119/04Y02T90/00
Inventor 何晶靖关雪飞栾超
Owner BEIHANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products