Triple concurrent fault analysis method and system, large unit equipment and storage medium
A fault analysis method and fault diagnosis technology, which can be used in the testing of computer parts, mechanical parts, and machine/structural parts, etc. It can solve the problems of difficult feature extraction, inaccurate prediction accuracy, and incomplete feature extraction.
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[0071] In order to make the object, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the examples. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.
[0072] Aiming at the problems existing in the prior art, the present invention provides a triple concurrent fault analysis method based on dimensionless and wavelet decomposition feature learning and gradient enhanced trees. The present invention will be described in detail below in conjunction with the accompanying drawings.
[0073] The triple concurrent fault analysis method based on dimensionless and wavelet decomposition feature learning and gradient enhanced tree provided by the embodiment of the present invention is as follows: figure 1 As shown, the specific implementation is as follows:
[0074] Step 1, data coll...
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