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X-ray backscattering detector

An x-ray and backscattering technology, applied in the field of scintillator detection of scattered x-rays, can solve the problems of poor portability, expensive production and operation, etc.

Pending Publication Date: 2021-02-23
THE BOEING CO
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, these high power x-ray backscatter systems are expensive to produce and operate, and are less portable

Method used

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  • X-ray backscattering detector
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  • X-ray backscattering detector

Examples

Experimental program
Comparison scheme
Effect test

Embodiment approach

[0093] Clause 1. A scintillator for use in an x-ray backscattering system (102), the scintillator (110) comprising:

[0094] an inorganic scintillator portion (112), the inorganic scintillator portion (112) is made of an inorganic scintillator material and includes one or more inorganic material elements (202), wherein the one or more inorganic material elements ( Each inorganic material element (202) in 202) includes:

[0095] an outer surface (204) configured to be adjacent to an object (120) to be scanned with the x-ray backscatter system (102), wherein the outer surface (204) is configured to received from

[0096] x-ray photons (122) reflected by the object (120); and

[0097] an inner surface (206) opposite the outer surface (204); and

[0098] an organic scintillator portion (114) made of an organic scintillator material and including a front surface (208), wherein at least a portion of the front surface (208) adjoins the one or more The inner surface (206) of at le...

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Abstract

Disclosed herein is an x-ray backscatter detector, specifically a scintillator for use in an x-ray backscattering system. The scintillator comprises an inorganic scintillator portion made of inorganicscintillating material and comprising one or more inorganic material elements. Each inorganic material element of the one or more inorganic material elements comprises an outer surface, and an innersurface opposite the outer surface. The outer surface is configured to be proximate to a subject to be scanned, such that the outer surface is configured to receive x-ray photons scattered by the subject. The scintillator also comprises an organic scintillator portion made of an organic scintillating material and comprising a front surface. At least a portion of the front surface abuts the inner surface of at least one of the one or more inorganic material elements.

Description

technical field [0001] The present disclosure relates generally to detection of scattered x-rays in x-ray backscattering systems, and more particularly to detection of scattered x-rays using scintillators comprising inorganic scintillation materials and organic scintillation materials. Background technique [0002] The x-ray backscattering system can be used for non-destructive inspection of an object (subject, object), including detection of non-line-of-site (non-line-of-site) features of the object. A conventional x-ray backscatter system consists of an x-ray tube and a detector. The detector includes a photomultiplier tube (PMT) and a scintillator. An x-ray tube emits x-rays towards an object. When x-rays collide with components of an object, the x-rays are diffracted and some of the x-ray photons travel toward the detector. When x-ray photons strike the outer surface of the scintillator, some x-rays are reflected from the outer surface and some x-rays penetrate the ou...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N23/203
CPCG01N23/203G01N2223/053G01N2223/1016G01N2223/505G01T1/2008G01V5/222C01P2006/60C09K11/06C09K11/616C09K11/664C09K11/684C09K2211/14G01N2223/5055G01T1/2006
Inventor M·萨法伊
Owner THE BOEING CO