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Light emission analysis device and maintenance method for same

A technology of luminescence analysis and condenser lens, which is applied in the fields of electrical excitation analysis, material excitation analysis, etc.

Pending Publication Date: 2021-02-23
SHIMADZU CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

For example, the maintenance period of the condenser lens can be judged based on the number of discharges, the number of days the device has been used, etc., but in the past, this judgment was entrusted to each user

Method used

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  • Light emission analysis device and maintenance method for same
  • Light emission analysis device and maintenance method for same
  • Light emission analysis device and maintenance method for same

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Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0024] 1. The overall structure of the luminescence analysis device

[0025] figure 1 It is a schematic diagram showing a configuration example of a light emission analysis device according to an embodiment of the present invention. This emission analyzer includes a sample mounting table 1 and electrodes 2 . A discharge chamber 11 is formed inside the sample mounting table 1 , and the tip of the electrode 2 faces into the discharge chamber 11 . An opening 12 is formed in a wall surface of the discharge chamber 11 at a position facing the tip of the electrode 2 . A solid sample 3 to be analyzed is placed on the sample mounting table 1 so as to close the opening 12 , and the surface of the sample 3 faces the tip of the electrode 2 with a gap therebetween.

[0026] During analysis, a voltage is applied to the electrode 2 to generate a discharge between the surface of the sample 3 and the tip of the electrode 2 . Light generated in the discharge cell 11 during discharge is co...

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Abstract

In the present invention, a detected intensity acquisition unit 52 acquires a detected intensity from a detector 43 when correction of this light emission analysis device is performed. A maintenance requirement determination unit 53 determines whether maintenance needs to be performed on a condensing lens by comparing the detected intensity acquired by the detected intensity acquisition unit 52 with a reference intensity. The detected intensity from the detector 43 is acquired when the periodic correction of the light emission analysis device is performed, and by comparing the detected intensity with the reference intensity, it is determined whether maintenance of the condensing lens is required. Thus, whether maintenance of the condensing lens is required is periodically checked, and on the basis of the comparison results between the detected intensity and the reference intensity, maintenance can be performed at a suitable timing.

Description

technical field [0001] The present invention relates to a luminescence analysis device and its maintenance method. The luminescence analysis device makes a sample emit light by discharging, condenses the light with a condenser lens, and detects it with a detector. The relationship is established against the obtained calibration curve to determine the chemical value of the sample. Background technique [0002] For example, an electrode is provided in the emission analysis device, and a sample is arranged to face the electrode. When analyzing a sample, a discharge is performed between the sample and the electrodes, and light generated by the discharge is received by a detector. Then, based on the intensity of light received by the detector, chemical values ​​such as the content of elements contained in the sample are analyzed (see, for example, Patent Document 1 below). [0003] The light generated from the sample by the discharge is condensed by the condensing lens and rece...

Claims

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Application Information

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IPC IPC(8): G01N21/67
CPCG01N21/67
Inventor 堀俊之
Owner SHIMADZU CORP
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