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A method for measuring the size parameters of strain gauge sensitive grid

A technology of parameter measurement and sensitive grid, applied in the direction of measuring device, measuring electrical variables, measuring resistance/reactance/impedance, etc., can solve the problem that cannot describe the change of strain gage resistance, the size parameter of sensitive grid is subjective, and the sensitive grid is specific. Difficult to determine the boundary and other problems, to achieve the effect of enriching measurement methods, good size parameters, and reducing accidental errors

Active Publication Date: 2022-04-08
NORTHWESTERN POLYTECHNICAL UNIV
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Problems solved by technology

Due to the corrosion process, the middle part of a good-quality sensitive gate is a continuous metal layer, but there will be a large number of discrete metal points on the sidewalls of the edge, which makes it difficult to determine the specific boundary of the sensitive gate, resulting in the obtained sensitive gate size parameter band It is subjective and cannot describe the change in the resistance of the strain gauge

Method used

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  • A method for measuring the size parameters of strain gauge sensitive grid
  • A method for measuring the size parameters of strain gauge sensitive grid
  • A method for measuring the size parameters of strain gauge sensitive grid

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Embodiment Construction

[0041] The features of the present invention are described below in conjunction with the accompanying drawings, and the examples given are only used to explain the present invention, and are not intended to limit the scope of the present invention.

[0042] In this embodiment, a system is used to measure the size parameters of the strain gauge sensitive grid. The system mainly includes a strain gauge profile image capture device, a computer, and grayscale image conversion in the method based on the strain gauge profile extraction method, Binarization, image filtering, contour detection, contour point extraction, least square fitting, establishment of Cartesian coordinate system, normalization of gray value, establishment of original curve of gray distribution of strain gauge, edge side wall of strain gauge sensitive grid The software for establishing the gray distribution fitting curve and measuring the size parameters of the sensitive grid according to the characteristic point...

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Abstract

The invention discloses a method for measuring the dimension parameter of the sensitive grid of the strain gauge. The dimension parameter of the sensitive grid of the strain gauge measured by the method can qualitatively reflect the resistance of the strain gauge, and belongs to the field of measuring the dimension parameter of the sensitive grid of the strain gauge. In this method, the topography image of the strain gauge is firstly captured by the camera; image preprocessing is performed based on the image, the Cartesian coordinate system is established, the original curve of the gray distribution of the strain gauge is established, and the gray distribution curve of the edge side wall of the strain gauge sensitive grid is fitted. The figure is established, and the size parameters of the strain gauge sensitive grid are measured according to the characteristic points of the fitting curve of the gray scale distribution of the edge side wall of the strain gauge sensitive grid. Wherein, the size parameter of the strain gauge sensitive grid refers to the width and grid spacing of the strain gauge sensitive grid. The original graph of the gray scale distribution of the strain gauge can reflect the information in the length and width directions of the sensitive grid of the strain gauge, so the inventive method can qualitatively reflect the resistance change of the strain gauge. The beneficial effect of the invention is that: the rapid and accurate measurement of the size parameter of the strain gauge sensitive grid and the qualitative reflection of the resistance change of the strain gauge are realized.

Description

technical field [0001] The invention relates to a method for measuring the dimension parameter of the sensitive grid of the strain gauge. The dimension parameter of the sensitive grid of the strain gauge measured by the method can qualitatively reflect the resistance of the strain gauge. The invention belongs to the field of dimension parameter measurement of a strain gauge sensitive grid. Background technique [0002] The preparation method of the strain gauge is to cover a layer of metal on the substrate, and form a sensitive grid by photolithography and corrosion processes. Due to the corrosion process, the middle part of a good-quality sensitive gate is a continuous metal layer, but there will be a large number of discrete metal points on the sidewalls of the edge, which makes it difficult to determine the specific boundary of the sensitive gate, resulting in the obtained sensitive gate size parameter band It is subjective and cannot describe the change in resistance of...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B11/24G01R27/02G06T7/181
CPCG01B11/24G01R27/02G06T7/181G06T2207/10016
Inventor 黎永前刘杨徐世庆
Owner NORTHWESTERN POLYTECHNICAL UNIV
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