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Strain gauge sensitive grid size parameter measurement method

A technology of parameter measurement and sensitive grid, applied in the direction of measuring device, measuring electrical variables, measuring resistance/reactance/impedance, etc., it can solve the problem that sensitive grid size parameters are subjective, cannot describe the change of strain gauge resistance, sensitive grid specific The boundary is difficult to determine and other problems, to achieve the effect of reducing accidental errors, improving measurement efficiency, and reducing workload

Active Publication Date: 2021-02-26
NORTHWESTERN POLYTECHNICAL UNIV
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Problems solved by technology

Due to the corrosion process, the middle part of a good-quality sensitive gate is a continuous metal layer, but there will be a large number of discrete metal points on the sidewalls of the edge, which makes it difficult to determine the specific boundary of the sensitive gate, resulting in the obtained sensitive gate size parameter band It is subjective and cannot describe the change in the resistance of the strain gauge

Method used

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  • Strain gauge sensitive grid size parameter measurement method
  • Strain gauge sensitive grid size parameter measurement method
  • Strain gauge sensitive grid size parameter measurement method

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Embodiment Construction

[0041] The features of the present invention are described below in conjunction with the accompanying drawings, and the examples given are only used to explain the present invention, and are not intended to limit the scope of the present invention.

[0042] In this embodiment, a system is used to measure the size parameters of the strain gauge sensitive grid. The system mainly includes a strain gauge profile image capture device, a computer, and grayscale image conversion in the method based on the strain gauge profile extraction method, Binarization, image filtering, contour detection, contour point extraction, least square fitting, establishment of Cartesian coordinate system, normalization of gray value, establishment of original curve of gray distribution of strain gauge, edge side wall of strain gauge sensitive grid The software for establishing the gray distribution fitting curve and measuring the size parameters of the sensitive grid according to the characteristic point...

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Abstract

The invention discloses a strain gauge sensitive grid size parameter measurement method, and belongs to the field of strain gauge sensitive grid size parameter measurement. The strain gauge sensitivegrid size parameter measured by the method can qualitatively reflect the resistance of a strain gauge. The method comprises the following steps: shooting a strain gauge morphology image through a shooting device; based on the image, carrying out image preprocessing, establishing a Cartesian coordinate system, establishing a strain gauge gray distribution original curve graph, establishing a straingauge sensitive grid edge side wall gray distribution fitting curve graph, and measuring strain gauge sensitive grid size parameters according to feature points of the strain gauge sensitive grid edge side wall gray distribution fitting curve graph. The dimension parameters of the strain gauge sensitive grid refer to the width and the grid spacing of the strain gauge sensitive grid. The strain gauge gray scale distribution original curve graph can reflect the information of the strain gauge sensitive grid in the length and width directions, so that the method can qualitatively reflect the resistance change of the strain gauge. The beneficial effects of the method are that the method achieves the quick and accurate measurement of the size parameters of the sensitive grid of the strain gauge and the qualitative reflection of the resistance change of the strain gauge.

Description

technical field [0001] The invention relates to a method for measuring the dimension parameter of the sensitive grid of the strain gauge. The dimension parameter of the sensitive grid of the strain gauge measured by the method can qualitatively reflect the resistance of the strain gauge. The invention belongs to the field of dimension parameter measurement of a strain gauge sensitive grid. Background technique [0002] The preparation method of the strain gauge is to cover a layer of metal on the substrate, and form a sensitive grid by photolithography and corrosion processes. Due to the corrosion process, the middle part of a good-quality sensitive gate is a continuous metal layer, but there will be a large number of discrete metal points on the sidewalls of the edge, which makes it difficult to determine the specific boundary of the sensitive gate, resulting in the obtained sensitive gate size parameter band It is subjective and cannot describe the change in resistance of...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/24G01R27/02G06T7/181
CPCG01B11/24G01R27/02G06T7/181G06T2207/10016
Inventor 黎永前刘杨徐世庆
Owner NORTHWESTERN POLYTECHNICAL UNIV
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