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Self-adjusting method and device for sample detection electrical parameters, medium and electronic equipment

A parameter adjustment and electrical parameter technology, applied in the field of electronic technology, can solve problems such as being unable to be widely used, limited testing personnel skill requirements, complexity, etc.

Active Publication Date: 2021-03-09
HONGZHUNDA TECH SHANGHAI
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method is not only complicated, but also limited by the skill requirements of the inspectors, and cannot be widely used

Method used

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  • Self-adjusting method and device for sample detection electrical parameters, medium and electronic equipment
  • Self-adjusting method and device for sample detection electrical parameters, medium and electronic equipment
  • Self-adjusting method and device for sample detection electrical parameters, medium and electronic equipment

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0041] figure 1 It is a flow chart of a self-adjustment method for sample detection electrical parameters provided in Embodiment 1 of the present application. This embodiment is applicable to the non-destructive testing of electronic devices such as chips. This method can be tested by the sample provided in the embodiment of the present application. The self-regulating device of electrical parameters is implemented, and the device can be realized by software and / or hardware, and can be integrated into electronic equipment.

[0042] Such as figure 1 As shown, the self-regulating method of the sample detection electric parameter comprises:

[0043] S110. Power on the sample according to the initial parameters, and acquire hot spots in the infrared image of the sample.

[0044] Wherein, the execution subject of this solution may be an electronic device with an infrared image capturing function, or an electronic device connected to an infrared image capturing device.

[0045] P...

Embodiment 2

[0100] Figure 4 It is a self-adjusting device for detecting electrical parameters of a sample provided in Embodiment 2 of the present application. The device can be implemented by software and / or hardware, and can be integrated into electronic equipment such as image acquisition.

[0101] Such as Figure 4 As shown, the device may include:

[0102] A hotspot acquiring module 410, configured to power on the sample according to the initial parameters, and acquire the hotspot in the infrared image of the sample;

[0103] A parameter adjustment module 420, configured to adjust the power-on parameters according to preset rules if a parameter adjustment event is detected;

[0104] The optimal parameter determining module 430 is configured to determine the optimal parameter according to the change rule of the hot spot.

[0105] A self-adjustment device for sample detection electrical parameters provided in an embodiment of the present invention can implement a self-adjustment met...

Embodiment 3

[0107] Embodiment 3 of the present application also provides a storage medium containing computer-executable instructions, the computer-executable instructions are used to perform a self-regulating method for detecting electrical parameters of a sample when executed by a computer processor, and the method includes:

[0108] According to the initial parameters, the sample is powered on, and the hot spots in the infrared image of the sample are obtained;

[0109] If a parameter adjustment event is detected, the power-on parameters are adjusted according to preset rules;

[0110] According to the change rule of the hot spot, the optimal parameters are determined.

[0111] A storage medium refers to any of various types of memory electronics or storage electronics. The term "storage medium" is intended to include: installation media such as CD-ROMs, floppy disks or tape drives; computer system memory or random access memory such as DRAM, DDR RAM, SRAM, EDO RAM, Rambus RAM, etc. ...

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PUM

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Abstract

The embodiment of the invention discloses a self-adjusting method and device for sample detection electrical parameters, a medium and electronic equipment. The method comprises the following steps: powering up a sample according to initial parameters to obtain a hot spot in an infrared image of the sample; if a parameter adjustment event is detected, adjusting the power-up parameters according toa preset rule; and determining an optimal parameter according to the change rule of the hot spot. By implementing the scheme, the hot spot can be formed in a power-up mode under a lossless condition,and the optimal parameter for the hot spot to reach the optimal state can be sought by controlling the power-up parameter.

Description

technical field [0001] The embodiments of the present application relate to the technical field of electronic technology, and in particular to a self-regulating method, device, medium and electronic equipment for detecting electrical parameters of a sample. Background technique [0002] Since the current world trend is technology and intelligence, various electronic devices are used more and more widely in the field of electronic technology. For devices such as chips, disks, and caches, due to the sharp increase in demand, the production volume is bound to fluctuate. After the electronic device is manufactured, the detection of its internal circuit is a relatively extensive technical problem at present. [0003] Among some existing detection methods, open detection results are the most accurate, but the electronic devices need to be disassembled, and this detection method is destructive and cannot be greatly promoted. In other detection methods, the top professional techni...

Claims

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Application Information

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IPC IPC(8): G01J5/00G01R31/52H03L7/099
CPCG01J5/0096G01J5/0066G01R31/52H03L7/099
Inventor 刘者龚慧兰秦丹
Owner HONGZHUNDA TECH SHANGHAI