Full-automatic chip aging test and PCB shielding test machine
A chip aging test, fully automatic technology, applied in the direction of conveyors, conveyor objects, transportation and packaging, etc., can solve the problems of high labor costs and low test efficiency, and achieve the effect of reducing labor costs and improving device testing efficiency
Active Publication Date: 2021-03-12
群沃电子科技(苏州)有限公司
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Problems solved by technology
[0003] The purpose of the present invention is to provide a fully automatic chip aging test and PCB shielding test machine to solve the problem of low test efficiency and high labor cost by manual testing of electronic devices
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[0034] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.
[0035] The purpose of the present invention is to provide a fully automatic chip aging test and PCB shielding test machine, which can improve device test efficiency and reduce labor costs.
[0036] In order to make the above objects, features and advantages of the present invention more comprehensible, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments.
[0037] figure 1 A thr...
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The invention relates to a full-automatic chip aging test and PCB shielding test machine. According to the full-automatic chip aging test and PCB shielding test machine, an automatic test cabinet is arranged in a machine metal plate; an X-axis horizontal moving mechanism of a mechanical arm is fixed on a high platform; the mechanical arm grabs a device test disc, places the device test disc in a test cell, and takes out the device test disc in the test cell; a tray rail is arranged on the machine metal plate; the tray rail is connected with an automatic feeding end and an automatic dischargingend at the two ends of the lower front part of the high platform; the automatic feeding end provides a to-be-tested device test disc, and the automatic discharging end stores the tested device test disc; a code scanner is arranged on the machine metal plate and is arranged above the feeding end of the tray rail; the code scanner scans the two-dimensional code on the device test disc and uploads device test information to a controller; and the controller controls the mechanical arm to carry the device test disc from a material disc rail to the test cell according to the device test information. According to the full-automatic chip aging test and PCB shielding test machine, the test efficiency of the device can be improved, and the labor cost is reduced.
Description
technical field [0001] The invention relates to the field of device aging test and wireless communication device shielding test, in particular to a fully automatic chip aging test and PCB shielding tester. Background technique [0002] Chip burn-in test is an electrical stress test method that uses voltage and high temperature to accelerate the electrical failure of devices. The burn-in process basically simulates running the chip for its entire life, because the electrical stimuli applied during the burn-in process reflect the worst-case conditions of chip operation. Depending on the aging time, the reliability of the obtained data may relate to the early life of the device or the degree of wear. Burn-in testing can be used as a test of device reliability or as a production window to discover early failures of devices. The complexity of chips is getting higher and higher. In order to ensure that there are no problems with the shipped chips, it is necessary to test before ...
Claims
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Login to View More IPC IPC(8): B65G47/91B65G47/74
CPCB65G47/914B65G47/917B65G47/74B65G2203/0216
Inventor 周光杰余振涛
Owner 群沃电子科技(苏州)有限公司