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Automobile steering lamp testing device

A test device and turn signal technology, which is applied in signal devices and other directions, can solve problems such as low detection efficiency and failure to detect car turn signal failures

Pending Publication Date: 2021-03-23
联晶智能电子有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In the prior art, a diagnostic device is usually used to check the turn signal of the car, but the diagnostic device can only detect the open circuit of the turn signal of the car, and cannot detect other faults of the turn signal of the car, resulting in low detection efficiency

Method used

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  • Automobile steering lamp testing device
  • Automobile steering lamp testing device
  • Automobile steering lamp testing device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0042] The present embodiment provides a kind of automobile turn signal test device, such as figure 1As shown, include: control module 1, waveform output control module 2, waveform comparison module 3 and power supply module 4, wherein, waveform output control module 21 is connected with control module 1 and the automobile turning lamp 9 to be tested, according to the control module 1 Drive automobile turn signal 9 under control, automobile turn signal 9 produces reference waveform and test waveform when working; Waveform comparison module 3 is connected with automobile turn signal 9, obtains reference waveform and described test waveform, waveform comparison module 3 is also used for The test waveform is converted into a fault waveform; the control module is connected with the waveform comparison module 3 to obtain the reference waveform and the fault waveform, and compares the reference waveform and the fault waveform to obtain the diagnosis result; the power module 4 is conn...

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PUM

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Abstract

The invention provides an automobile steering lamp testing device. The automobile steering lamp testing device comprises a control module; a waveform output control module which is connected with thecontrol module and a to-be-tested automobile steering lamp and drives the automobile steering lamp under the control of the control module, wherein the automobile steering lamp generates a reference waveform and a test waveform during working; a waveform comparison module which is connected with the automobile steering lamp to obtain a reference waveform and a test waveform, wherein the waveform comparison module is further used for converting the test waveform into a fault waveform; the control module is connected with the waveform comparison module and is used for acquiring a reference waveform and a fault waveform and comparing the reference waveform with the fault waveform to obtain a diagnosis result; and a power module which is connected with the control module, the waveform output control module and the waveform comparison module and used for providing power for the control module, the waveform output control module and the waveform comparison module. Various faults (including open circuits and wrong patch elements) of the automobile steering lamp can be recognized, and the test requirements of various faults of the automobile steering lamp are met.

Description

technical field [0001] The invention belongs to the technical field of automobile lamp detection, and in particular relates to an automobile turn signal detection device. Background technique [0002] As one of the important components of the car, the turn signal of the car needs to be tested after production. In the prior art, a diagnostic device is usually used to check the turn signal of the car, but the diagnostic device can only detect the open circuit of the turn signal of the car, and cannot detect other faults of the turn signal of the car, resulting in low detection efficiency. Contents of the invention [0003] In order to overcome the above-mentioned technical defects, the present invention provides a test device for an automobile turn signal lamp, which can detect various faults of the automobile turn signal lamp. [0004] In order to solve the above problems, the present invention is realized according to the following technical solutions: [0005] A test de...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B60W50/02B60Q11/00
CPCB60Q11/007B60W50/0205
Inventor 陈路明罗彪何贵平蓝贤福曾照明侯宇
Owner 联晶智能电子有限公司
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