Flash storage error detection method and circuit, storage medium and terminal

Abstract

The invention discloses a flash storage error detection method and circuit, a storage medium and a terminal, a special configuration signal is adopted in a CP test mode, a flash to be tested can use anormal write instruction to write fixed data in the test mode, data is read and compared at the same time through a read instruction in the test mode, and a mark signal of a comparison result is output. Meanwhile, wrong addresses are stored, and a damaged area can be replaced with a redundant storage area when the flash to be tested is powered on next time, the whole flash to be tested does not need to be written in and then read out, the storage area which cannot be erased in the chip can be determined while testing is conducted, the detection efficiency of flash storage errors is greatly improved, and redundancy replacement is achieved, by adopting the scheme, the flash yield can be effectively improved, the production cost is reduced, and the chip which cannot be erased and the storagearea which cannot be erased in the chip can be quickly detected in the CP test stage.

Description

technical field [0001] The invention relates to the technical field of flash detection, in particular to a method, circuit, storage medium and terminal for detecting errors in flash storage. Background technique [0002] Because the domestic flash technology is not perfect, when the flash leaves the factory, there is a certain probability that some storage area circuits of the flash cannot be erased successfully. In order to improve the yield and reliability of the flash, the redundant storage area (redundance ) to replace the area that cannot be erased successfully. [0003] But before the replacement, it is necessary to detect the location of the area that cannot be erased by the flash. The traditional method is to erase the entire flash, and then read the data of the entire flash, and then compare the data to determine the address of the wrong data, and then Know the location of the area that cannot be erased by the flash, and then use the redundant storage area (redunda...

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a method, circuit, storage medium and terminal for detecting errors in flash storage, aiming to solve the problem that the existing flash needs to write data in the whole chip when performing redundant replacement, and then read the data in the whole chip for comparison The method leads to slow operation efficiency and is not suitable for CP testing

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