Substrate processing apparatus
A substrate processing device and substrate technology, which is applied in the fields of electrical components, semiconductor/solid-state device manufacturing, circuits, etc., and can solve problems such as difficult-to-handle substrates
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no. 1 approach
[0256]
[0257] figure 1 It is a top plan view of the substrate processing apparatus of the first embodiment. The substrate processing apparatus 1 processes the substrate W.
[0258] The substrate W is, for example, a semiconductor wafer, a substrate for a liquid crystal display, an organic EL (FLAT PANEL DISPLAY), a substrate, a magnetic disk substrate, a disc substrate, a photomagical substrate, a light mask Substrates with substrates or solar cells.
[0259] The substrate processing apparatus 1 has an indexer portion 2. The degreasse unit 2 has a plurality of (e.g., four) receiving frame mounting units 3. Each of the accommodating frame mounting unit 3 is separately placed on a housing frame C. The accommodating frame C accommodates the plurality of substrate W. The accommodating frame C is, for example, a FOUP (Front Opening Unified POD: ancestral wafer conveying cartridge).
[0260] The accommodating frame C has a bar code (not shown). The bar code is, for example, an iden...
no. 2 approach
[0382] The substrate processing apparatus 1 of the second embodiment will be described with reference to the drawings. Further, the same structure as the first embodiment will be given the same reference numerals, and detailed description is omitted.
[0383] The substrate processing apparatus 1 of the second embodiment has substantially the same structure as the substrate processing apparatus 1 of the first embodiment. The processing unit 14 of the second embodiment performs different actions different from the processing unit 14 of the first embodiment. Next, the operation of the processing unit 14 of the second embodiment will be exemplified.
[0384]
[0385] In the operation example of the processing unit 14 of the second embodiment, the control unit 18 changes the amount QT of the blowout in accordance with the position of the recess 24. In the operation example of the processing unit 14 of the second embodiment, the control unit 18 changes the amount of blowing amount QT b...
no. 3 approach
[0416] The substrate processing apparatus 1 of the third embodiment will be described with reference to the drawings. Further, the same structure as the first embodiment will be given the same reference numerals, and detailed description is omitted.
[0417] The substrate processing apparatus 1 of the third embodiment has substantially the same structure as the substrate processing apparatus 1 of the first embodiment. The processing unit 14 of the third embodiment performs different actions different from the processing unit 14 of the first embodiment. Next, the operation of the processing unit 14 of the third embodiment will be exemplified.
[0418]
[0419] In the operation example of the processing unit 14 of the third embodiment, the control unit 18 changes the amount QT of the blowout according to the speed of the plate 32.
[0420] Figure 9 It is a flow chart showing the step of controlling the control of the control unit 18 and the operation of the processing unit 14.
...
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