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A high-precision measurement method, electronic equipment and medium suitable for background schlieren

A measurement method and high-precision technology, applied in measurement devices, measurement optics, optical radiation measurement, etc., can solve the problems of high cost, poor convenience, and low measurement accuracy, and achieve the effect of improving measurement accuracy

Active Publication Date: 2021-11-30
NAT UNIV OF DEFENSE TECH
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Problems solved by technology

[0005] On the one hand, the present invention provides a high-precision measurement method suitable for background schlieren to solve the technical problems of high cost, low measurement accuracy, and poor convenience in the application of the existing background schlieren technology

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  • A high-precision measurement method, electronic equipment and medium suitable for background schlieren
  • A high-precision measurement method, electronic equipment and medium suitable for background schlieren
  • A high-precision measurement method, electronic equipment and medium suitable for background schlieren

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Embodiment Construction

[0049]It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined with each other. The present invention will be described in detail below with reference to the accompanying drawings and examples.

[0050] refer to Figure 1 to Figure 3 , a high-precision measurement method adapted to background schlieren, comprising steps:

[0051] S1. Using the imaging target surface to obtain a pair of background lattice images in the presence / absence of an optical distortion field;

[0052] S2. Setting M and N query windows of the same size along the x direction and the y direction in the query area of ​​the pair of bitmaps respectively, to obtain an M×N query window array;

[0053] S3. Carry out cross-correlation calculation processing, calculate the equivalent refraction point of light, the coordinates of the centroid of the query window before and after deflection on the imaging target surface, and...

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Abstract

The invention discloses a high-precision measurement method, an electronic device and a medium suitable for background schlieren. The method comprises the steps of: obtaining a pair of lattice images of a background lattice respectively in the presence or absence of an optical distortion field ; Set M and N query windows of the same size along the x direction and the y direction respectively in the query area of ​​the pair of bitmaps to obtain an M×N query window array; perform cross-correlation calculation processing to calculate the equivalent refraction of light Point, the coordinates of the centroid of the query window before and after the deflection on the imaging target surface and the coordinates on the corresponding background lattice; the distance Z between the interfaces where the equivalent refraction occurs in combination with the background lattice optical distortion field d , the distance Z between the interface where the equivalent refraction of the optical distortion field occurs and the diaphragm a , the distance Z between the diaphragm and the imaging target surface i , the coordinates of the centroid of the interrogation window before and after the deflection occurs on the imaging target surface, and calculate the deflection angle of the light in the x and y directions of the centroid of the corresponding interrogation window.

Description

technical field [0001] The invention relates to the technical field of wavefront measurement, in particular to a high-precision measurement method adapted to background schlieren, electronic equipment and media. Background technique [0002] At present, optical testing technology has been widely used in scientific and engineering research due to its characteristics of non-contact and high temporal and spatial resolution measurement. Application scenarios include biomedical imaging, astronomical observation, high-speed flow field measurement, semiconductor manufacturing, and metrology. For high-speed flow field measurement, relying on a variety of advanced optical testing technologies can achieve effective acquisition of a variety of information. Among many flow field optical testing techniques, Background Oriented Schlieren (BOS) technology has been widely used in the measurement of flow field quantitative information due to its simple structure, low price and convenient us...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J9/00
CPCG01J9/00G01J2009/002
Inventor 丁浩林易仕和
Owner NAT UNIV OF DEFENSE TECH