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Solid-state laser power measurement calibration method and device

A solid-state laser and power measurement technology, which is applied in the direction of measuring circuits and photometry using electric radiation detectors, can solve problems such as laser power inconsistency, affecting the use of laser devices, and optical path pollution.

Active Publication Date: 2021-04-20
深圳瑞丰恒激光技术有限公司
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Problems solved by technology

[0004] In actual work, there is a problem that the actual laser power of the generated laser does not match the required laser power, which may be caused by factors such as xenon lamp attenuation, crystal damage, resonant cavity damage, optical path pollution, or water path pollution.
When the actual laser power does not match the required laser power, it will affect the use of the laser device

Method used

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  • Solid-state laser power measurement calibration method and device
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  • Solid-state laser power measurement calibration method and device

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Embodiment Construction

[0065] It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0066] In the following description, use of suffixes such as 'module', 'part' or 'unit' for denoting elements is only for facilitating description of the present invention and has no specific meaning by itself. Therefore, 'module', 'part' or 'unit' may be used in combination.

[0067] combine figure 1 As shown, in the illustrated embodiment, the solid-state laser power measurement calibration method includes the following steps:

[0068] S1. Through the photodiode laser power sensor located inside the solid-state laser, the optical signal emitted by the solid-state laser is photoelectrically converted to obtain a voltage signal corresponding to the optical power;

[0069] S2. Convert the voltage signal corresponding to the optical power into a digital signal corresponding to the level quantization of the optical po...

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Abstract

The embodiment of the invention provides a solid-state laser power measurement calibration method and device. The method comprises the following steps of carrying out photoelectric conversion on an optical signal emitted by a solid laser to obtain a voltage signal corresponding to optical power, converting the voltage signal corresponding to the optical power into a level quantized digital signal corresponding to the optical power, carrying out anti-pulse interference processing on the optical power level quantized digital signal, namely an optical power level quantized value, and then carrying out average filtering to obtain an optical power level quantized average value, obtaining a corresponding optical power level quantized threshold value revision value according to a preset threshold value, and performing segmented calibration according to the optical power level quantized threshold value revision value and a reference power value detected by a thermoelectric laser power probe located outside the solid-state laser to obtain an optical power output level quantization calibration value. By implementing one embodiment, the measurement feedback value of the photodiode type laser power probe can be corrected, so that the measurement feedback value is close to the actual power value of the solid-state laser.

Description

technical field [0001] The embodiment of the present application relates to the technical field of laser power calibration before delivery, and provides a method and device for measuring and calibrating the power of a solid-state laser. Background technique [0002] It should be declared that the technical content involved in this article is made to improve the understanding of the application, and it does not mean that the content can necessarily be regarded as the prior art. [0003] At present, with the development of technology, the development of solid-state lasers has made amazing progress, which is known as the revival era of solid-state lasers. Solid-state lasers are widely used in military, processing, medical and scientific research fields. It is commonly used in ranging, tracking, guidance, drilling, cutting and welding, annealing of semiconductor materials, micromachining of electronic devices, atmospheric detection, spectral research, surgery and ophthalmic ope...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J1/44G01J1/42
Inventor 陶孝收胡德洲陈福平邱志彬
Owner 深圳瑞丰恒激光技术有限公司
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