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A Calibration Method for High Power Millimeter Wave Intensity Measurement System

A technology for intensity measurement and system calibration, applied in the field of millimeter waves, can solve problems such as inaccurate measurement of high-power millimeter-wave intensity distribution and inability to accurately locate high-power millimeter-wave output ports, and achieve low difficulty in development, simple structure, and convenient operation Effect

Active Publication Date: 2022-03-18
HUAZHONG UNIV OF SCI & TECH
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Problems solved by technology

[0005] In view of the above defects or improvement needs of the prior art, the present invention provides a high-power millimeter-wave intensity measurement system calibration method, the purpose of which is to solve the problems caused by the inability to precisely locate the high-power millimeter-wave output port, the target plate and the infrared camera. Technical problems that lead to inaccurate measurement of high-power millimeter-wave intensity distribution

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  • A Calibration Method for High Power Millimeter Wave Intensity Measurement System
  • A Calibration Method for High Power Millimeter Wave Intensity Measurement System
  • A Calibration Method for High Power Millimeter Wave Intensity Measurement System

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[0027] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0028] The invention provides a calibration method for a high-power millimeter-wave intensity measurement system, such as figure 1 As shown, the high-power millimeter-wave intensity measurement system to be calibrated includes: high-power millimeter-wave output port 1, target plate 2, and infrared camera 4; the frequency of high-power millimeter-wave is 30GHz-200GHz, and the power of high-power ...

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Abstract

The invention discloses a calibration method for a high-power millimeter wave intensity measurement system, which belongs to the technical field of millimeter waves. The method includes: establishing a three-dimensional Cartesian coordinate system based on the geometric center of the high-power millimeter-wave output port and the target plate; setting at least three markers in the plane where the high-power millimeter-wave output port and the target plate are located; Perform imaging; based on the imaging coordinates of the marker and the corresponding three-dimensional coordinates, coordinate transformation is used to calculate the imaging parameters from the high-power millimeter-wave output port and the target plate to the camera, and then the rotation of the high-power millimeter-wave output port to the target plate is obtained. Translation relationship: adjust the measurement system according to the rotation and translation relationship transformed from the high-power millimeter-wave output port to the target plate, and complete the system calibration. The method of the invention has low difficulty in development, high reliability and strong versatility, and can realize parameter calibration of a high-power millimeter-wave intensity measurement system and improve measurement accuracy.

Description

technical field [0001] The invention belongs to the technical field of millimeter waves, and more specifically relates to a calibration method for a high-power millimeter wave intensity measurement system. Background technique [0002] In the field of magnetic confinement controlled nuclear fusion research, there are various heating methods for plasma. Among them, high-power millimeter wave is a heating method widely used in fusion devices because of its good heating effect and good heating localization. Usually, in addition to the main mode signal, there is a certain proportion of miscellaneous mode signals in the high-power millimeter wave in the heating system. These miscellaneous mode signals are generally deposited in the system by heat, and in severe cases, it will affect the normal operation of the system. Even damage the system, so it is extremely important to analyze the mode purity information of high-power millimeter waves and further reduce the proportion of mixe...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R23/02
Inventor 夏冬辉范国垚王之江
Owner HUAZHONG UNIV OF SCI & TECH