Secondary mean filtering algorithm for instruments and meters

Abstract

The invention discloses a secondary mean filtering algorithm for instruments and meters, which adopts secondary filtering, filtering parameters are set as follows: a = 11, b = 4, and the filtering period is 131.072 ms; wherein the sampling rate is 4 us, 2n is adopted as the accumulation frequency, and a divider is not adopted. An acquisition result is filtered based on FPGA high-speed AD acquisition, and the algorithm is also suitable for effective filtering processing of other controllers after high-speed AD acquisition. The authenticity and stability of the voltage and current readback value of the instrument head can be ensured, the reliability is high, the filtering frequency can be flexibly selected in an extremely wide width range, and the execution efficiency is high.

Description

technical field [0001] The invention relates to an instrument, in particular to an instrument and meter secondary mean filtering algorithm. Background technique [0002] In order to ensure the authenticity and stability of the voltage and current readback values ​​of the instrument meter head, it is necessary to pass certain processing technology to meet the filtering effect of the acquisition results of the readback voltage and current parameters in the instrumentation equipment. [0003] In the prior art: [0004] 1. Finite (FIR) filtering, such as figure 1 Shown: [0005] Under high-frequency sampling, the filter order increases too much when the low-pass filter frequency is higher, which leads to occupying too many FPGA resources and cannot be synthesized and laid out. And because the normalization is difficult when the coefficient is an integer, the filtering result is attenuated; and the floating-point operation takes up more resources, and the execution efficiency ...

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