Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Defect detection model evaluation method and device

A technology for model evaluation and defect detection, which is applied in character and pattern recognition, instruments, data processing applications, etc., can solve problems such as inability to detect algorithms and models, and achieve the effect of ensuring diversity and integrity and accurate detection performance

Pending Publication Date: 2021-05-04
YUNNAN POWER GRID CO LTD ELECTRIC POWER RES INST
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] This application provides a defect detection model evaluation method and device to solve the technical problem that the algorithm model cannot be accurately detected in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Defect detection model evaluation method and device
  • Defect detection model evaluation method and device
  • Defect detection model evaluation method and device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0040] The embodiments will be described in detail hereinafter, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numerals in different drawings refer to the same or similar elements unless otherwise indicated. The implementations described in the following examples do not represent all implementations consistent with this application. These are merely examples of systems and methods consistent with aspects of the present application as recited in the claims.

[0041] refer to figure 1 , figure 1 It is a schematic flowchart of a defect detection model evaluation method provided by the present invention. Such as figure 1 shown, including the following steps:

[0042] Step 101. Obtain original sample data from the main network, substation and distribution network of the power supply company respectively, and construct a sample database.

[0043] In step 101, the original sample data ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a defect detection model evaluation method and device, and the method comprises the steps: obtaining original sample data from a main network, a transformer substation and a distribution network of a power supply company, and constructing a sample database; obtaining a to-be-evaluated algorithm model, selecting training sample data from the sample database, inputting the training sample data into the to-be-evaluated algorithm model for training, and obtaining the trained to-be-evaluated algorithm model; selecting verification sample data from the sample database, inputting the verification sample data into the trained to-be-evaluated algorithm model, and obtaining an output result of the trained to-be-evaluated algorithm model; according to the verification sample data and the output result, obtaining a verification index of the to-be-evaluated algorithm model; and obtaining an evaluation report of the to-be-evaluated algorithm model according to the verification index. Therefore, the performance of the to-be-evaluated algorithm model can be accurately detected.

Description

technical field [0001] The present application relates to the technical field of detection models, in particular to a defect detection model evaluation method and device. Background technique [0002] With the advancement of power grid informatization, machine learning algorithms are more and more widely used in power grids. Various recognition and detection algorithms emerge in endlessly, and the performance of the algorithms cannot be evaluated uniformly, which makes the application and research of machine learning algorithms unable to be guided objectively and fairly. Therefore, in the prior art, the algorithm model cannot be accurately detected. Contents of the invention [0003] The present application provides a defect detection model evaluation method and device to solve the technical problem that the algorithm model cannot be accurately detected in the prior art. [0004] In a first aspect, the present invention provides a method for evaluating a defect detection...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06Q10/06G06Q50/06G06K9/62
CPCG06Q10/06393G06Q50/06G06F18/2148G06F18/214
Inventor 李仕林李国友方正云杨映春赵明陈永青
Owner YUNNAN POWER GRID CO LTD ELECTRIC POWER RES INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com