Test method and device, electronic equipment and computer storage medium

Abstract

The embodiment of the invention relates to the technical field of testing, and discloses a testing method and device, electronic equipment and a computer storage medium, and the testing method comprises the steps: receiving a testing request sent by a client for any micro-service, wherein the any micro-service is a real service and / or a baffle service, the real service comprises a service of a service node marked by a baffle pointer in the test link, the baffle service comprises services of service nodes except the service node marked by the baffle pointer in the test link, and the test link comprises a plurality of service nodes; then, obtaining routing information of each service node included in any micro-service; and then, based on the routing information of each service node included in any micro-service, testing the test request and returning a corresponding test result. According to the method provided by the embodiment of the invention, the service nodes are marked in a pointer manner, so that the zero-invasion and pluggable baffle is achieved, and meanwhile, the baffle can be freely adjusted left and right like a vernier.

Description

technical field [0001] The embodiments of the present application relate to the field of testing, and specifically, the present application relates to a testing method, device, electronic equipment, and computer storage medium. Background technique [0002] In the field of Internet distributed technology, the architecture model of microservices has gradually occupied the mainstream position. After the application module is split into microservices, the dependencies and collaboration network between services become intricate. How to improve the testability of microservices with external dependencies will directly affect the cycle and quality of software delivery. [0003] In the existing microservice testing technology, the way of developing interface baffle program is often used to solve the external dependency problem. For example, when testing an interface, mock testing is often used to simulate the actual working environment. Mock testing is to create a virtual object fo...

AI Technical Summary

Problems solved by technology

[0004] However, the inventors of the present application found in the process of specific examples that the use of the baffle program itself has great limitations

First of all, the baffle program itself is not flexible enough. Each service that needs to be mocked needs to write a baffle separately, and the result returned by calling the baffle program is a static result, and it is impossible to return a specific response according to different inputs.

Second, when the interface of the microservice under test changes, the bezel program needs to be modified and upgraded in a targeted manner. In the early stage of development, the frequency of interface changes is very high

Third, the baffle program needs to be deployed separately and takes up hardware resources

Fourth, the implantation of the baffle may require modifying the calling address in the code configuration file. If there is intrusion into the service code, the removal of the baffle also needs to be removed manually.

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