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AD chip testing device and testing method thereof

A chip testing and chip technology, applied in measuring devices, electronic circuit testing, measuring electricity, etc., can solve the problems of difficult chip disassembly, easy repeated testing, low AD chip testing efficiency, etc., to improve testing efficiency and facilitate disassembly and assembly. Effect

Pending Publication Date: 2021-05-11
NANJING GUODIAN NANZI POWER GRID AUTOMATION
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  • Summary
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] In order to solve the problems of low testing efficiency of AD chips, difficulty in chip disassembly and assembly, and easy repeated testing in the prior art, the present invention proposes an AD chip testing device and its testing method. Different analog signals, automatically test the measurement accuracy error of multiple AD chips, quickly screen out faulty AD chips, easy disassembly and assembly of chips, and higher test efficiency

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  • AD chip testing device and testing method thereof
  • AD chip testing device and testing method thereof
  • AD chip testing device and testing method thereof

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Embodiment Construction

[0042] Below in conjunction with accompanying drawing, technical scheme of the present invention will be further described:

[0043] The present invention proposes a kind of AD chip testing device, such as figure 1 , 2 As shown, it mainly includes a tester 1, a control terminal 2, a chip screening module 3 and at least one chip test module 4. One end of the tester and the output end of the chip test module are respectively connected to the control terminal, and the other end of the tester is connected to the chip test module. The input end of the control terminal is also connected to the chip test module.

[0044] The control terminal (such as a PC) can generate control signals according to the test requirements, and output the control signals to the tester through the network port. The tester outputs analog signals of different frequencies and different amplitudes to the chip test module according to the control signals, and the chip test There are multiple AD chips connect...

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Abstract

The invention discloses an AD chip testing device and a testing method thereof, and aims to solve technical problems of low AD chip testing efficiency, difficulty in chip disassembly and assembly and easiness in repeated testing in the prior art. The method comprises the following steps: outputting analog quantity signals with different frequencies and different amplitudes according to a control signal; enabling an AD chip to carry out data conversion on the analog quantity signals to obtain a measurement analog quantity, and enabling the AD chip to obtain a null drift signal; and calculating a chip measurement error and a null drift value according to the analog quantity signals, the measurement analog quantity and the null drift signal, and performing fault AD chip screening. According to the invention, AD chip testing can be automatically carried out, the testing efficiency is high, the speed is high, and rapid and accurate AD chip screening is realized.

Description

technical field [0001] The invention relates to an AD chip testing device and a testing method thereof, belonging to the technical field of chip testing. Background technique [0002] AD7606 is an 8-way synchronous AD chip, which has the advantages of cheap price and excellent performance, so it has been widely used in the field of electric power applications. At present, many domestic manufacturers have produced AD chips that are fully compatible with AD7606, which can be used as a substitute for AD7606. However, there is still a certain gap between domestic AD chips and AD7606. The performance parameters of different individuals vary greatly, so AD chips must be Screen to find chips with relatively good performance. In addition, because the analog quantity acquisition function is very important, problems may lead to abnormal protection functions, so AD chips need to undergo various tests before batch use to ensure that the chip performance can meet the performance require...

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Application Information

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IPC IPC(8): G01R31/28G01R31/01
CPCG01R31/2851G01R31/01
Inventor 陈庆旭吴凯陈从靖岳峰周兆庆张尧余华武
Owner NANJING GUODIAN NANZI POWER GRID AUTOMATION