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QFN chip image acquisition device and image acquisition method thereof

An image acquisition device and chip technology, applied in the detection field, can solve the problems of low detection efficiency, inability to meet the continuous high-precision detection requirements of QFN chip packaging and testing, poor reliability, etc., and achieve the effect of improving efficiency and accuracy

Pending Publication Date: 2021-05-25
JIANGSU UNIV OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] In related technologies, the method of manually detecting chips is generally used. This method has low detection efficiency and poor reliability, and cannot meet the continuous and high-precision detection requirements of QFN chip packaging and testing.

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  • QFN chip image acquisition device and image acquisition method thereof

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Embodiment Construction

[0039] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0040] The QFN chip image acquisition device and its image acquisition method proposed in the embodiments of the present invention are described below with reference to the accompanying drawings.

[0041] figure 1 is a schematic block diagram of a QFN chip image acquisition device according to an embodiment of the present invention. figure 2is a perspective view of a QFN chip image acquisition device according to an embodiment of the present invention. Amon...

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Abstract

The invention provides a QFN chip image acquisition device and an image acquisition method thereof, and the device comprises an X-axis servo motion sliding table device, a Y-axis servo motion sliding table device, a Y-axis auxiliary motion sliding table device, a Z-axis hand-operated motion sliding table device, a camera, a lens, a light source, a charging tray clamp, a rack and an upper computer. The upper computer is in serial port communication with the PLC and the camera through communication lines and is used for sending a control instruction to the PLC, so that the PLC controls the X-axis servo motion sliding table device and the Y-axis servo motion sliding table device to work, the camera is controlled to move in the X-axis direction and the Y-axis direction, and QFN chip images collected by the camera are obtained. The device can carry out continuous and high-precision image acquisition on the QFN chip in the charging tray, movement is completed at the speed of 12mm / s, the detection resolution of characters on the surface of a shot chip image reaches 20 microns, detailed feature information of the surface of the chip can be effectively obtained, and a certain basis is provided for chip surface defect detection.

Description

technical field [0001] The invention relates to the technical field of detection, in particular to a QFN (Quad Flat No-lead Package, square flat no-lead package) chip image acquisition device and an image acquisition method for the QFN chip image acquisition device. Background technique [0002] QFN is a surface-mount chip packaging technology that is small in size, light in weight, and uses plastic as a sealing material. The conductive path between the internal pins and the pads of the QFN package is short, the wiring resistance is very low, and it has excellent electrical properties, and the pads have direct heat dissipation channels, and the heat dissipation is good. QFN packaging technology is widely used in mobile phones, digital cameras and other portable devices. High-density printed circuit boards for small electronic devices. However, due to factors such as production technology and environment, cracks, foreign objects, scratches, holes and other defects will appea...

Claims

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Application Information

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IPC IPC(8): G01N21/956G01N21/01
CPCG01N21/956G01N21/01G01N2021/95638
Inventor 巢渊唐寒冰刘文汇周伟徐鹏
Owner JIANGSU UNIV OF TECH