Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Birefringence measuring device and ordinary light and extraordinary light measuring method based on birefringence measuring device

A measurement device and measurement method technology, applied in the field of optical measurement, can solve problems such as difficult to measure samples smaller than 5mm, and achieve the effect of small calculation amount, simple calculation formula and precise structure

Active Publication Date: 2021-06-01
ZHIJING NANOTECH CO LTD
View PDF7 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The purpose of the present invention is to provide a birefringence measurement device to solve the technical problem that existing measurement devices are difficult to measure samples to be measured less than 5mm

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Birefringence measuring device and ordinary light and extraordinary light measuring method based on birefringence measuring device
  • Birefringence measuring device and ordinary light and extraordinary light measuring method based on birefringence measuring device
  • Birefringence measuring device and ordinary light and extraordinary light measuring method based on birefringence measuring device

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0044] The present invention is described in detail below in conjunction with examples, but the present invention is not limited to these examples.

[0045] see figure 1 , the present embodiment provides a birefringence measuring device, comprising: a polarized light generating unit 1, a light-shielding sheet 2 with a light-transmitting hole 2-1, and an analyzer 4; the polarized light generating unit 1 is arranged at the incident The light side; the analyzer 4 is arranged on the outgoing light side of the shading sheet 2; the sample 3 to be measured is arranged between the shading sheet 2 and the analyzer 4; the shading sheet 2 is used to block incident light deviating from the light transmission hole. Thereby removing redundant light spots in the light path. In this embodiment, a light-shielding sheet 2 is provided on the incident light side of the sample to be measured 3, and the measurement size of the sample to be measured 3 is limited by setting the size of the light-tra...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

PropertyMeasurementUnit
thicknessaaaaaaaaaa
Login to View More

Abstract

The invention discloses a birefringence measuring device and an ordinary light and extraordinary light measuring method based on the birefringence measuring device. The birefringence measuring device comprises a polarized light generating unit, an anti-dazzling screen with a light hole and a polarization analyzer, the polarized light generation unit is arranged on the incident light side of the anti-dazzling screen; the polarization analyzer is arranged on the emergent light side of the anti-dazzling screen; a sample to be tested is arranged between the anti-dazzling screen and the polarization analyzer; the anti-dazzling screen is used for blocking incident light deviating from the light hole. The anti-dazzling screen is arranged on the incident light side of the to-be-measured sample, and the incident light deviating from the light hole is shielded by the anti-dazzling screen so that the measuring device can measure the to-be-measured sample of any size. According to the ordinary light and extraordinary light measuring method, the ordinary light refractive index and the extraordinary light refractive index of the to-be-measured sample can be obtained only by using the light intensity of the polarized light outputted by the birefringence measuring device and using a simple calculation formula without using reflected light to calculate the refractive index, the calculation formula is simple, the calculation amount is small, and the result is accurate.

Description

technical field [0001] The application relates to a birefringence measuring device and a method for measuring ordinary light and extraordinary light based on the device, belonging to the technical field of optical measurement. Background technique [0002] Birefringence is a phenomenon in which a light beam incident on an anisotropic crystal is decomposed into two beams of light, and the two beams of light are refracted in different directions. After the light wave is incident on the anisotropic crystal, except for the special direction, birefringence will occur, and it will be decomposed into two kinds of polarized light whose vibration directions are perpendicular to each other, different propagation speeds, and different refractive indices. One of the rays obeys the law of refraction, called ordinary ray, or O-ray for short; the other ray does not refract according to the angle of the law of refraction, called extraordinary ray, or E-ray for short. [0003] In the prior ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/41
CPCG01N21/41
Inventor 陈小梅张用友钟海政柏泽龙
Owner ZHIJING NANOTECH CO LTD
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products