Bottom covered edge detection method based on contour fitting comparison and related device
A detection method and edge-wrapping technology, which is applied in the field of defect detection, can solve problems such as complex morphological characteristics of good products, achieve stable detection results, reduce misjudgment rates, and improve detection accuracy
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[0059] In order to enable those skilled in the art to better understand the solution of the present application, the technical solution in the embodiment of the application will be clearly and completely described below in conjunction with the accompanying drawings in the embodiment of the application. Obviously, the described embodiment is only It is a part of the embodiments of this application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.
[0060]The present application designs a bottom wrapping detection method based on contour fitting comparison and related devices, which achieves the beneficial effect of stable detection effect, improves detection accuracy, and reduces detection misjudgment rate.
[0061] For ease of understanding, see figure 1 , figure 1 It is a method flow chart of a bottom edg...
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