Power semiconductor characteristic parameter test system

Abstract

The invention relates to the technical field of power semiconductor characteristic parameter testing, and provides a power semiconductor characteristic parameter testing system which comprises a low-voltage instrument equipment unit, a low-voltage control unit, a high-voltage instrument equipment unit, a high-voltage control unit, a device adaptation unit and a testing main control unit. The low-voltage control unit comprises a low-voltage project related component and a relay group; the relay groups are respectively arranged among the low-voltage item related parts, the low-voltage instrument equipment unit and the power device to be tested and preset corresponding conduction states according to different types of low-voltage parameter test items; the relay group enables the low-voltage item related component, the low-voltage instrument equipment unit and the to-be-tested power device to switch the connection state according to a preset conduction state so as to form a test circuit corresponding to the test item; and test circuits of low-voltage test items are integrated together, the test connection mode can be changed through the relay set, and switching of different test items is automatically achieved.

Description

technical field [0001] The invention relates to the technical field of power semiconductor characteristic parameter testing, in particular to a power semiconductor characteristic parameter testing system. Background technique [0002] Among all power semiconductor devices, fully controlled devices represented by MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor) and IGBT (Insulated Gate Bipolar Transistor) are represented by Its excellent comprehensive characteristics such as voltage drive, low loss, and fast switching have won large-scale applications in many fields. [0003] In order to ensure the effective use of power semiconductor devices in power electronic systems, it is necessary to test the characteristic parameters of the devices before use. With the development of higher voltage and larger capacity devices and modules, it is necessary to test their characteristic parameters. The test system also puts forward new requirements. [0004] In order to fully u...

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Problems solved by technology

[0007] The technical problem to be solved by the present invention is to overcome the defect that the above-mentioned existing test equipment needs to be rebuilt when testing different items, which is not only time-consuming and costly, but also to provide a power semiconductor with complete testing functions and flexible adjustment according to the test items. Parametric test system, by quickly switching to the matching test circuit, it takes less time and costs less

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