A multifunctional testing method, device and system for multiplexing pins of a SOC chip

Abstract

The invention discloses a multifunctional testing method, device and system for SOC chip multiplexing pins. The method configures the state of the first port and pin state according to the function to be tested and selects a corresponding communication protocol, then executes the corresponding software test code to perform the test and generates test information according to the test signal. The device includes an instruction receiving module, a function testing module and a test reporting module. The system includes an external control board, a platform board to be tested, an automatic test board and external equipment, wherein the automatic test board includes the above-mentioned device. The method, device and system not only realize the automatic testing of any function to be tested by automatically bridging the platform board to be tested and external equipment, but also realize the automatic testing of multiple functions to be tested by sequentially sending multiple function test instructions through the external control board Automatic switching test.

Description

technical field [0001] The invention relates to the field of automatic testing of SOC chip multiplexing pins, and relates to a multifunctional testing method, device and system for SOC chip multiplexing pins. Background technique [0002] At present, the system development based on SOC chip is related to the design and verification work on the development board. The pins of the SOC chip are usually multiplexed into several groups of different functions. If these multiplexed functions are to be implemented on the development board function, it is necessary to add an analog switch or jumper cap to the signal from the same pin to jump to the corresponding functional module, and the current chip pins often have multiple multiplexed functions. On the one hand, the design of the development board will be very complicated. On the other hand, when switching functions manually, there are many combinations to choose, and it is easy to make mistakes in manual switching. [0003] In th...

AI Technical Summary

Problems solved by technology

The current solution is that hardware engineers participate in the test. For the hardware functions involved in upgrading the software function modules, each part of the function modules is manually tested and verified. This leads to a large number of repeated tests to be done on the one hand, and the time progress is relatively slow. In addition, On the one hand, it takes a lot of working time for engineers and squeezes out the company's R&D resources

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