Radio frequency integrated circuit test system and control method thereof

Abstract

The invention discloses a radio frequency integrated circuit test system. The system comprises: an upper computer, a bottom hardware control module, a test fixture board and a programmable test apparatus. The system is characterized in that: a serial port module, a circuit function setting module and a parameter test module are arranged in the upper computer; the bottom hardware control module comprises a single chip microcomputer and the single chip microcomputer is provided with a MCU serial port module, a data operation module, a MCU function initialization module and a circuit setting operation module; the serial port module is used for communication between the upper computer and the single chip microcomputer of the bottom hardware control module; the circuit function setting module is used to set and select a working mode of the test system; the parameter test module is used to select a test parameter and carry out corresponding function setting to the test parameter; function call of an automation test can be provided; read-write control is carried out to the programmable test apparatus; whether a test result is qualified is determined and indication is performed. The system can be widely used for the control and test analysis of the radio frequency circuit.

Description

Technical field [0001] The invention relates to a test system and method, in particular to a radio frequency integrated circuit test system and control method. Background technique [0002] With the development of integrated circuits, there is an increasing tendency for digital-analog hybrid monolithic integrated circuits. The analog part is controlled by the digital function module inside the circuit. Therefore, for the test analysis of the integrated circuit, the digital function module part needs to be verified first, so as to achieve the normal operation of the analog part controlled by the digital function module. Because the digital function modules integrated in different circuits are not the same, including I2C communication protocol, SPI serial communication protocol, logic level control, etc. As for the radio frequency integrated circuit, according to different units such as the receiving channel, the transmitting channel, and the frequency synthesizer, the parameter i...

AI Technical Summary

Problems solved by technology

For radio frequency integrated circuits, according to different units such as receiving channels, transmitting channels, and frequency synthesis, the parameter indicators vary greatly

Therefore, for different circuits, the hardware part of the test system needs to be produced separately, and the program part of the test system also needs to write different interface control programs according to different protocols, resulting in heavy workload, high cost, long cycle and low efficiency.

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