Object defect detection method and device

Abstract

The invention provides an object defect detection method and device. The method comprises the following steps: acquiring a sample image set containing a plurality of sample images; determining a pixel area corresponding to each bounding box; dividing the sample image set into a plurality of sample images according to the pixel area of each bounding box; performing training based on each sample image to obtain an instance segmentation model; obtaining an object image to be detected; respectively inputting an object image to be detected into the plurality of instance segmentation models so as to detect a defect category in the object image and a bounding box where the defect is located; and in response to the fact that the detected defect is a real defect, obtaining a detected defect category and a bounding box. Therefore, after the sample images are classified, the multiple instance segmentation models are constructed, the object defects are detected through the multiple instance segmentation models, it can be guaranteed that the obtained defects are real defects, the defect detection rate is increased, the false detection rate is reduced, and the industrial practicability is high.

Description

technical field [0001] The invention relates to the technical field of industrial inspection, in particular to an object defect detection method and an object defect detection device. Background technique [0002] At present, the detection of defects on the surface of industrial site objects is becoming more and more important. [0003] In related technologies, a defect detection model is usually used to detect object defects in industrial sites. However, defects have the characteristics of rich categories and large spans. Therefore, the detection rate of object defects is low and the false detection rate is high. The problem is that the engineering practicability is low. Contents of the invention [0004] In order to solve one of the above technical problems, the present invention proposes the following technical solutions. [0005] The embodiment of the first aspect of the present invention proposes a method for detecting object defects, including: obtaining a sample i...

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Problems solved by technology

[0003] In related technologies, a defect detection model is usually used to detect object defects in industrial sites. However, defects have the characteristics of rich categories and large spans. Therefore, the detection rate of object defects is low and the false detection rate is high. problem, low engineering practicability

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