Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Adversarial network texture surface defect detection method based on abnormal feature editing

A texture surface and defect detection technology, applied in the field of image processing, can solve the problems of few defect samples, difficult to collect and label, etc., and achieve the effect of high detection accuracy

Pending Publication Date: 2021-01-01
HUAZHONG UNIV OF SCI & TECH
View PDF2 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] At present, there are still three difficulties in the detection of textured surface defects: various types of textures, that is, there are many kinds of regular and irregular textures, and there are many types of defects, that is, multiple defects may appear on the same textured surface, and there are few defect samples in the industry, so it is difficult to collect with annotations, therefore, defect detection on textured surfaces remains an extremely challenging problem
Some existing research results can only partially meet the accuracy and robustness requirements of texture surface defect detection

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Adversarial network texture surface defect detection method based on abnormal feature editing
  • Adversarial network texture surface defect detection method based on abnormal feature editing
  • Adversarial network texture surface defect detection method based on abnormal feature editing

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0062] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention. In addition, the technical features involved in the various embodiments of the present invention described below can be combined with each other as long as they do not constitute a conflict with each other.

[0063] An adversarial network texture surface defect detection method based on abnormal feature editing provided by an embodiment of the present invention includes an offline training phase and an online detection phase:

[0064] The offline training phase includes:

[0065] S1. Artificially generated defects:

[0066] On the picture of good products without defects I o Generate the correspon...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention belongs to the technical field of image processing, and particularly discloses an adversarial network texture surface defect detection method based on abnormal feature editing. The adversarial network texture surface defect detection method comprises the following steps of: acquiring defect-free good product images and corresponding defect images to form an image data set jointly; constructing an adversarial network which comprises a generator and a discriminator, wherein the generator is used for extracting image features, detecting abnormal features and then editing the abnormal features by using normal features to obtain a reconstructed image, and the discriminator is used for discriminating the good product images and the reconstructed image; training the adversarial network through using the image data set according to a pre-constructed optimization target, so as to obtain a reconstructed image generation model; and inputting an image to be detected into the reconstructed image generation model to obtain a reconstructed image corresponding to the image to be detected, and further acquiring the texture surface defects according to the image to be detected and thecorresponding reconstructed image. The adversarial network texture surface defect detection method has high detection precision for defects of different shapes, sizes and contrast ratios on differenttexture surfaces.

Description

technical field [0001] The invention belongs to the technical field of image processing, and more particularly relates to a method for detecting surface defects of an adversarial network texture based on abnormal feature editing. Background technique [0002] In the field of industrial manufacturing, due to factors such as the quality of raw materials and complex manufacturing processes, texture defects will occur on the surface of products, such as mobile phone screens, wood, textiles, and ceramic tiles. Texture defects refer to localized areas of irregular brightness changes or disruption of textural structure. These texture defects will directly affect the user experience. In order to control product quality, all types of texture defects should be effectively controlled during the manufacturing process, so defect detection is the basis and key to improving the entire industrial manufacturing industry. [0003] The image recognition technology only needs to collect the te...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06T7/00G06T7/41G06T7/44G06K9/62G06N3/04G06N3/08
CPCG06T7/0008G06T7/41G06T7/44G06N3/088G06T2207/10004G06T2207/20032G06T2207/20081G06T2207/20084G06N3/045G06F18/23213
Inventor 杨华尹周平周勤远宋开友
Owner HUAZHONG UNIV OF SCI & TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products