Combined test data generation method and related equipment based on interaction relationship
A technology of combined testing and data generation, applied in electrical digital data processing, software testing/debugging, error detection/correction, etc., which can solve the problems of reduced error detection ability of test data and too much redundant test data.
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[0064] In order to make the purpose, technical solutions and advantages of the present application more clearly understood, the present application will be described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application, but not to limit the present application.
[0065] refer to figure 1 , an embodiment of the present application provides a method for generating combined test data based on an interaction relationship, including:
[0066] S1: obtain several interaction relationship sets, component parameter sets and parameter value sets of the component to be tested;
[0067] S2: Calculate the number of intersection parameters included in each of the interaction relationship sets by calculating the coverage requirement metric function, and generate an initial coverage matrix in combination with the component parameter set and t...
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