A method for observing the phase boundary of materials using phase-locked infrared imaging

Abstract

The invention discloses a method for observing the material phase boundary of a material by using phase-locked infrared imaging, comprising the following steps: first, positive and negative alternating driving currents are connected to both ends of the material with phase distribution, and due to the Peltier effect, the two ends of the phase boundary are connected. The side generates periodic heat absorption and exotherm of the same frequency as the driving current, generates periodic temperature modulation and infrared radiation, and then uses the phase-locked infrared nondestructive detection device to capture the infrared signal of the same frequency as the driving current to obtain the near-surface temperature of the sample caused by the pyroelectric effect. distribution to determine the location of the internal phase boundaries of the material.

Description

technical field [0001] The present invention relates to the field of thermoelectric effect and the field of non-destructive testing. Specifically, the method of using phase-locked infrared imaging to observe the material phase boundary, using the Peltier effect and the active phase-locked infrared nondestructive testing device. Background technique [0002] Defects and second phases in materials will seriously affect their quality and application. Traditional methods to characterize the internal defects and phase distribution of materials include metallographic microscopy, transmission electron microscopy, X-ray diffraction, corrosion observation, infrared flaw detection, etc. Most of these methods rely on the material's absorption and reflection of photons, electrons, etc., or chemical reactivity, and have strict constraints on the size and surface of the material. Among them, the traditional active phase-locked infrared flaw detection technology uses electric heating or l...

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Problems solved by technology

[0002] Defects and second phases in materials will seriously affect its quality and application. Traditional means of characterizing the distribution of defects and phase regions in materials include metallographic microscopy, transmission electron microscopy, X-ray diffraction, corrosion observation, infrared flaw detection, etc. Most of these methods rely on the absorption and reflection of photons, electrons, etc. or chemical reactivity of materials, and have strict restrictions on the size and surface of materials.

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