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A method and device for quickly and fully parsing stdf files

A file and fast technology, applied in the direction of file system, file/folder operation, instrument, etc., can solve the problems of program crash, time-consuming, consumption, etc., and achieve the effect of low cost and improved analysis performance

Active Publication Date: 2021-11-30
江苏泰治科技股份有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method takes a long time when parsing a large STDF file, and consumes a large amount of memory, causing the program to crash easily. Therefore, only a part of the data can be parsed, and the full amount cannot be parsed, which seriously restricts the analysis of STDF data. and application

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  • A method and device for quickly and fully parsing stdf files
  • A method and device for quickly and fully parsing stdf files
  • A method and device for quickly and fully parsing stdf files

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Embodiment Construction

[0057] The technical solution of the present invention will be further described below in conjunction with the accompanying drawings.

[0058] STDF, standard test data file, is in the form of a binary byte stream, using a unified format to save various types of data generated during chip testing. The data consists of one record (Record), each record (Record) contains a 4-byte header (Header) and information of variable length. In order to distinguish different types of data, records are divided into multiple types, identified by record type (Record Type), common types are MIR (Master Information Record), MRR (Master Results Record), PIR (Part Information Record) , PRR (Part Results Record) and so on.

[0059] refer to figure 1 , according to the concept of the present invention, fast and full analysis of the STDF file mainly includes two core steps: dividing the STDF file into blocks, and finding the initial analysis position of each block according to the rules; based on th...

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PUM

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Abstract

The invention proposes a method and device for quickly and fully analyzing STDF files. The method includes: dividing the STDF file into blocks, finding the initial parsing position of each block according to rules; and performing parallel parsing on the split blocks based on a distributed computing engine. In the present invention, multiple machines can be used to perform distributed parallel analysis on a single STDF file, greatly reducing the analysis time of the STDF file, thereby improving the efficiency of using data in the STDF file. By quickly and fully analyzing the data in STDF, it is possible to conduct a comprehensive analysis of chip test results.

Description

technical field [0001] The invention belongs to the technical field of semiconductor testing, and in particular relates to a method and equipment for parsing STDF files. Background technique [0002] STDF (Standard Test Data Format) is a standard test data file, which is a storage specification for chip test data in the semiconductor industry, and is widely used in CP (Chip Probe) and FT (Final Test) tests. In the form of binary byte stream, it adopts a uniform format to save various types of data generated during chip testing, which solves the problem that the format of test data generated by different testing machines is not uniform. Therefore, in the semiconductor industry, testing machine suppliers, chip testing companies, and chip design companies all attach great importance to and are willing to accept this specification. [0003] By fully analyzing the data in STDF, it is possible to conduct a comprehensive analysis of chip test results, including Lot, Wafer, Die, te...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06F16/16G06F16/172G06F16/182
CPCG06F16/16G06F16/172G06F16/182
Inventor 徐祖峰丁小果张永健
Owner 江苏泰治科技股份有限公司
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