Method for improving electrical testing efficiency of PCB

Abstract

The invention provides a method for improving the electrical testing efficiency of a PCB, which comprises a testing mechanism and comprises the following steps: S1, testing preparation: an operator puts a board to be tested on a feeding table and splices two or more SET circuit boards together according to the direction of a testing mold; S2, testing: a feeding mechanism sucks more than two SET circuit boards and puts the SET circuit boards into a testing mold; and S3, repeating the next test. According to the invention, one or more groups of material receiving suction nozzles and independent electromagnetic valve control are added, when a test is carried out, if a good plate and a bad plate exist, a controller independently switches on and off one group of electromagnetic valves, the good plate is sucked into a PASS material receiving area, and the bad plate is sucked into an SHORT material receiving area or an OPEN material receiving area according to the test condition. Meanwhile, in combination with visual identification, the discharging vehicle-mounted devices in different colors represent qualified or unqualified products, the discharging tables in different positions represent qualified or unqualified products, the discharging vehicle-mounted devices are easy to achieve, only the visual identification module needs to be fixed to the ceiling, existing equipment layout is not affected, implementation is convenient, and plate mixing can be effectively prevented.

Description

technical field [0001] The invention belongs to the technical field of PCB, and in particular relates to a method for improving the efficiency of PCB electric measurement. Background technique [0002] In the testing process of the printed circuit board industry, the circuit boards divided into shipping sizes (SET) are generally energized with test probes on each circuit to test whether there are open and short circuits in the circuit. The test principles used in the industry are basically the same. To improve the test efficiency, the method of testing multiple SETs at one time is generally used, that is, the original test method tests 1 SET at a time, and the current test 2 SETs at a time, the efficiency can be doubled. This method directly improves the test efficiency, but the multi-SET test cannot pick out the good products that fail the test, which invisibly reduces the PASS rate once. For example: there are 100SET boards, of which 5SETs actually have open and short circ...

AI Technical Summary

Problems solved by technology

The existing multi-SET testing method has the following problems: in the case of unqualified test, the SET qualified products cannot be sucked into the qualified product area, and the SET unqualified products can be sucked into the unqualified product area, and at the same time mixed into the PASS board Re-testing is still required, and one more repeated test may also cause quality problems such as too deep pad printing

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