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Conductive film fragmentation test method

A testing method and conductive film technology, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems of low testing efficiency and low testing accuracy, and achieve the effect of improving testing efficiency and testing accuracy

Pending Publication Date: 2021-10-15
苏州菱麦自动化设备科技有限公司
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] For this reason, the technical problem to be solved by the present invention is to overcome the defects of low test efficiency and low test accuracy of the conductive film test method in the prior art

Method used

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  • Conductive film fragmentation test method

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Embodiment Construction

[0025] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments, so that those skilled in the art can better understand the present invention and implement it, but the examples given are not intended to limit the present invention.

[0026] In the processing and manufacturing of conductive films, a thin film layer is usually attached to the surface of the conductive film, and the thin film layer acts as a turnover protection to prevent damage to the conductive film product during the turnover process, and then it needs to be turned over after the subsequent process is completed. The protective film is torn off.

[0027] The conductive film of this embodiment includes a body, the front of the body is connected with a first thin film layer, and the reverse side of the body is connected with a second thin film layer, that is, the first thin film layer and the second thin film layer both play a turnover protection ...

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Abstract

The invention relates to a conductive film fragmentation test method, and the method comprises the following steps: placing a plurality of stacked conductive films on a feeding tray, and conveying the feeding tray to a fragmentation device; separating a piece of conductive film from the multiple stacked conductive films through a piece separating device; tearing the front and back surfaces of the separated conductive film; conveying the torn conductive film to a detection station by using a manipulator, and testing the conductivity of the conductive film at the detection station; placing the conductive film which is tested to be qualified in a discharging tray; and after the discharging tray is full, conveying the discharging tray to a discharging station. According to the invention, fragmentation and testing of the conductive film can be automatically realized, and the testing efficiency and the testing accuracy are greatly improved.

Description

technical field [0001] The invention relates to the technical field of conductive film processing, in particular to a slice test method for conductive films. Background technique [0002] Transparent conductive film is the core component of many electronic products. For example, conductive film is a key component of touch screen products. In the production line of conductive film, the conductive film needs to be tested in slices. However, the existing conductive film test methods are generally It is to use manual testing, the workload is heavy, the testing efficiency is low, and the testing accuracy is low, which cannot meet the testing requirements. Contents of the invention [0003] Therefore, the technical problem to be solved by the present invention is to overcome the defects of low test efficiency and low test accuracy of the conductive film test method in the prior art. [0004] In order to solve the above-mentioned technical problems, the present invention provide...

Claims

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Application Information

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IPC IPC(8): G01R31/01
CPCG01R31/013
Inventor 杜剑
Owner 苏州菱麦自动化设备科技有限公司