Semiconductor module testing equipment for waste collection
A technology for waste collection and testing equipment, which is used in semiconductor/solid-state device manufacturing, mechanical component testing, machine/structural component testing, etc., and can solve problems such as the impact of semiconductor module testing and the difficulty of re-collecting the volume of limit bumps.
Active Publication Date: 2022-02-11
江苏卓玉智能科技有限公司
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Problems solved by technology
[0002] During the detection process of the semiconductor module, the limit protrusion used for positioning the semiconductor module will fall, and the fallen limit protrusion has a small volume. If the limit protrusion is not collected uniformly, the limit protrusion It is easy to affect the detection of the semiconductor module after falling around, and it is very difficult to collect it again due to the small volume of the limit protrusion
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[0075] In order to make the purposes, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are part of the embodiments of the present invention, but not all of them. example. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.
[0076] This embodiment provides a semiconductor module detection device for waste collection, including: a platform 1 and an adsorption device 2, the adsorption device 2 is arranged on the platform 1, and the adsorption device 2 is suitable for adsorbing and fixing the semiconductor module 6 On the platform 1 , the limiting protrusions 63 on the semiconductor module 6 are removed, and the...
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The invention belongs to the technical field of intelligent machinery, and specifically relates to a semiconductor module detection device for waste collection, which includes: a platform, an adsorption device, the adsorption device is arranged on the platform, and the adsorption device is suitable for adsorbing and fixing the semiconductor module On the platform, the stop protrusion on the semiconductor module falls off; the collection device is arranged on one side of the platform, and the collection device is suitable for collecting the fallen stop protrusion, so as to realize the The unified collection of the limit protrusions prevents the impact of the limit protrusions falling around on the detection of the semiconductor module.
Description
technical field [0001] The invention belongs to the technical field of intelligent machinery, and in particular relates to a semiconductor module detection device for waste collection. Background technique [0002] During the detection process of the semiconductor module, the limit protrusions used for positioning the semiconductor modules will fall, and the dropped limit protrusions are small in size. If the limit protrusions are not collected uniformly, the limit protrusions will It is easy to affect the detection of semiconductor modules after being dropped around, and it is very difficult to collect them again due to the small size of the limiting protrusions. [0003] Therefore, based on the above technical problems, it is necessary to design a new semiconductor module testing device for waste collection. SUMMARY OF THE INVENTION [0004] The object of the present invention is to provide a semiconductor module inspection device for waste collection. [0005] In orde...
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IPC IPC(8): G01N3/08G01N3/02G01M13/00H01L21/683
CPCG01N3/08G01N3/02G01M13/00H01L21/6838
Inventor 梅力胡冬云
Owner 江苏卓玉智能科技有限公司