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Detection probe of solar cell

A technology for solar cells and detection probes, applied in the field of detection probes for solar cells, can solve problems affecting test accuracy and reliability, twisting of spring axes, etc., so as to ensure reliability, reduce jamming, and provide good guidance. effect of action

Pending Publication Date: 2021-11-26
LONGI SOLAR TECH (XIAN) CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0004] The embodiment of the present application provides a detection probe for solar cells to solve the problem that the spring in the probe in the related art tends to twist the axis when it is stressed, which makes it difficult for the probe of the probe to completely contact with the solar cell, affecting Test Accuracy and Reliability

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  • Detection probe of solar cell
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Embodiment Construction

[0020] The following will clearly and completely describe the technical solutions in the embodiments of the present application with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are part of the embodiments of the present application, not all of them. Based on the embodiments in this application, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the scope of protection of this application.

[0021] It should be understood that reference throughout the specification to "one embodiment" or "an embodiment" means that a particular feature, structure, or characteristic related to the embodiment is included in at least one embodiment of the present application. Thus, appearances of "in one embodiment" or "in an embodiment" in various places throughout the specification are not necessarily referring to the same embodiment. Furthermore, the particular features...

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Abstract

The invention provides a detection probe of a solar cell. The detection probe comprises a probe column, a probe sleeve and a spring. the probe sleeve comprises a cover plate and a hollow sleeve, and the cover plate covers one end of the sleeve; the two ends of the spring are ground flat and tightly combined, the spring is placed in the sleeve and can freely stretch out and draw back in the sleeve in the axis direction of the sleeve, and one end of the spring abuts against the cover plate. The probe column sequentially comprises a penetrating section, an abutting section, a matching part and a probe from one end to the other end; the penetrating section and the abutting section are located in the sleeve, the penetrating section is close to the cover plate and penetrates through the part of the spring, the matching section is partially located in the sleeve and partially extends out of the sleeve, and the penetrating section, the abutting section and the matching section are all in clearance fit with the inner wall of the sleeve; an inward protruding structure is arranged on the inner wall of the sleeve and used for limiting the abutting section to the side, close to the cover plate, of the protruding structure. In the use process of the probe, the spring can stretch out and draw back in the axis direction of the sleeve when being stressed, and the probe column is guided to move in the axis direction.

Description

technical field [0001] The present application relates to the technical field of solar cell production and manufacturing, in particular to a detection probe for solar cells. Background technique [0002] Before the solar cell is finished, the solar cell must be tested for current and voltage (Circuit Voltage, IV) and electroluminescence (EL). The IV test is mainly used for the efficiency test of the solar cell, and the EL test is mainly used for the defect test of the solar cell. Currently, IV testing and EL testing are performed on solar cells by probes. [0003] However, the spring in the existing probe is prone to axis distortion when it is stressed, which not only leads to abnormal friction between the needle column of the probe and the sleeve of the probe, resulting in stagnation, but also makes it difficult for the probe of the probe to be accurate. Positioning, which affects the reliability of the test. Contents of the invention [0004] The embodiment of the pre...

Claims

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Application Information

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IPC IPC(8): H02S50/10
CPCH02S50/10Y02E10/50
Inventor 庞朝江李瑞波崔国庆申朝锋姚亮博陈博王维涛刘锦鹏
Owner LONGI SOLAR TECH (XIAN) CO LTD